IP Library › Granted Patent US 12,615,828
Granted Patent B2
US 12,615,828 · App. 18/077,856 · Granted Apr 28, 2026

Semiconductor device having dot-shaped field plate electrode

Inventors: Hiroaki Katou (Nonoichi Ishikawa, JP); Katsura Miyashita (Naka Kanagawa, JP); Saya Shimomura (Komatsu Ishikawa, JP); Tsuyoshi Kachi (Kanazawa Ishikawa, JP); Tatsuya Nishiwaki (Yokohama Kanagawa, JP)
Assignees: Kabushiki Kaisha Toshiba; Toshiba Electronic Devices & Storage Corporation
H10D64/112H10D30/668H10D64/117H10D64/519
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Quick Facts
Patent No.
US 12,615,828
App. No.
18/077,856
Granted
Apr 28, 2026
Kind
B2
Abstract

A semiconductor device includes a first electrode, a second electrode located on the first electrode, a semiconductor part located between the first electrode and the second electrode, a first interconnect located between the semiconductor part and the second electrode, a third electrode located in the semiconductor part and separated from the semiconductor part, a fourth electrode located lower than the third electrode in the semiconductor part, a first plug connecting the second electrode to the fourth electrode, and a second plug. The third electrode includes a ring portion, and an extension portion extending from the ring portion into an interior of the ring portion. The fourth electrode is located in the interior of the ring portion in a plane perpendicular to a vertical direction. The fourth electrode is separated from the semiconductor part. The second plug connects the first interconnect to the extension portion.

Claims (40)

1 . A semiconductor device, comprising:

a first electrode;

a second electrode located above the first electrode;

a semiconductor part located between the first electrode and the second electrode;

a first interconnect located between the semiconductor part and the second electrode;

a third electrode located in the semiconductor part and separated from the semiconductor part, the third electrode including

a ring portion, and

an extension portion extending from a part of the ring portion that is less than an entirety of the ring portion, into an interior of the ring portion;

a fourth electrode located in the semiconductor part and located lower than the third electrode in a vertical direction, the fourth electrode being located in the interior of the ring portion in a plane perpendicular to the vertical direction, the fourth electrode being separated from the semiconductor part;

a first plug connecting the second electrode to the fourth electrode; and

a second plug connecting the first interconnect to the extension portion.

2 . The device according to claim 1 , wherein the third electrode includes only one extension portion.

3 . The device according to claim 1 , wherein

the extension portion extends in a first direction from the ring portion, and

the first plug and the second plug are arranged in the first direction.

4 . The device according to claim 1 , wherein an outer edge of the first plug is aligned with an outer edge of the fourth electrode or is located inward of the outer edge of the fourth electrode in a plane perpendicular to the vertical direction.

5 . The device according to claim 1 , wherein a thickness in a radial direction of the ring portion is not less than 10 nm and not more than 50 nm.

6 . The device according to claim 1 ,

wherein the semiconductor part includes:

a first semiconductor layer connected to the first electrode, the first semiconductor layer being of a first conductivity type,

a second semiconductor layer located on the first semiconductor layer, the second semiconductor layer being of a second conductivity type, and

a third semiconductor layer located on a portion of the second semiconductor layer, the third semiconductor layer being of the first conductivity type, and

wherein the ring portion faces the second semiconductor layer via an insulating member.

7 . The device according to claim 6 , further comprising:

a third plug connecting the second electrode to the second and third semiconductor layers,

the first plug and the second plug being arranged in a first direction,

the first direction crossing a second direction,

the second direction being from the first plug toward the third plug,

the first interconnect extending in the second direction.

8 . The device according to claim 6 , further comprising:

a metal member located in the semiconductor part,

the metal member being connected to the second semiconductor layer, the third semiconductor layer, and a third plug.

9 . The device according to claim 1 , wherein

the first plug and the second plug include tungsten, and

the second electrode includes aluminum or copper.

10 . The device according to claim 9 , wherein the first interconnect includes aluminum or copper.

11 . The device according to claim 9 , wherein the first interconnect includes tungsten.

12 . The device according to claim 1 , wherein an outer edge of the ring portion is hexagonal in the plane perpendicular to the vertical direction.

13 . The device according to claim 1 , wherein the extension portion terminates at a free end disposed within the interior of the ring portion.

14 . The device according to claim 1 , wherein the extension portion is laterally surrounded by an insulating member disposed within the interior of the ring portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 8, 2022
From: KATOU, HIROAKI; MIYASHITA, KATSURA; SHIMOMURA, SAYA; KACHI, TSUYOSHI; NISHIWAKI, TATSUYA
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 062031/0258 →
Priority Claims (1)
JP 2022-140260 · Sep 2, 2022 · national
Continuity (1)
Related Publication 20240079460A1 · Mar 7, 2024
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