Method for analyzing metal microparticles, and inductively coupled plasma mass spectrometry method
A method for analyzing a sample containing metal fine particles with an inductively coupled plasma mass spectrometer. The method enables analysis of the sample without the need of standard metal fine particles. Specifically, the present invention relates to a method for analyzing metal fine particles in liquid by use of an inductively coupled plasma mass spectrometer. In the method, the analysis apparatus is provided with a standard solution introduction apparatus including a standard solution storage unit for storing a standard solution containing a specific element in a known concentration, a syringe pump for suctioning and discharging the standard solution, and a solution introduction unit having a standard solution nebulizer and a standard solution spray chamber that are supplied with the standard solution, the standard solution is directly supplied to the standard solution nebulizer at a flow rate of 3 μL/min or less.
1. A method for analyzing metal fine particles in gas comprising use of an inductively coupled plasma mass spectrometer, the spectrometer comprising:
a gasified sample introduction section including a sample nebulizer and a sample spray container which introduces a sample gas generated by a laser ablation device comprising a laser which evaporates and atomizes a sample by irradiating a solid sample to be measured with laser light, or a gas exchange device which replaces by argon gas with a gas component of the sample gas containing an object to be measured; and
a torch section which ionizes the sample and forms a plasma; an interface section which takes ions from the plasma; a mass analyzer which separates ions; and a detector which detects the separated ions, wherein the method comprises:
providing the inductively coupled plasma mass spectrometer with a standard solution introduction apparatus comprising a storage unit which stores a standard solution containing a specific element in a known concentration, a syringe pump which stores and discharges the standard solution, and a standard solution introduction unit having a standard solution nebulizer that is supplied with the standard solution, and a standard solution spray chamber combined with the standard solution nebulizer,
connecting a standard solution introduction passage which introduces the standard solution flowing out from the standard solution spray chamber to a flow passage connecting the gasified sample introduction section to the torch section,
supplying the standard solution directly to the standard solution nebulizer at a flow rate of 3 μL/min or less thereby introducing the standard solution into the torch section from the standard solution introduction unit, and determining a standard solution sensitivity value that is a specific element weight per standard solution signal intensity count based on a standard solution signal intensity obtained from a detector and a physical amount of the introduced specific element, and
calculating a particle diameter value of metal fine particles of the specific element from a signal intensity count number of one metal fine particle of the specific element, which is obtained from the detector by introducing the sample gas, and the standard solution sensitivity value.
2. An inductively coupled plasma mass spectrometry method which analyzes a metal fine particle number and a metal fine particle concentration defined in claim 1 by using the standard solution sensitivity value in the method which analyzes metal fine particles in gas, wherein the method comprises:
introducing the sample gas to be measured into the torch section from the sample introduction section thus measuring the number of specific element metal fine particles obtained from the detector, and
calculating a metal fine particle concentration of the sample gas from a total integrated value of specific element metal fine particle signal intensities obtained from the detector by introduction of the sample gas, the standard solution sensitivity value and the introduction rate of the sample gas.