Alternating hardmasks for tight-pitch line formation
A method for forming fins includes forming a three-color hardmask fin pattern on a fin base layer. The three-color hardmask fin pattern includes hardmask fins of three mutually selectively etchable compositions. Some of the fins of the first color are etched away with a selective etch that does not remove fins of a second color or a third color and that leaves at least one fin of the first color behind. The fins of the second color are etched away. Fins are etched into the fin base layer by anisotropically etching around remaining fins of the first color and fins of the third color.
1. A method of manufacturing a semiconductor integrated circuit comprising:
forming a topography above a substrate, the topography comprising upper surfaces of first, second, and third hardmask fins, wherein:
upper surfaces of the first hardmask fins comprise a first composition;
upper surfaces of the second hardmask fins comprise a second composition;
upper surfaces of the third hardmask fins comprise a third composition;
the hardmask fins are formed in a plurality of repeatable blocks; and
the hardmask fins of each repeatable block are formed in a sequence of ABCB, where: A represents a first hardmask fin, B represents second hardmask fins, and C represents a third hardmask fin;
forming a first mask over the topography and selectively etching one or more of the first hardmask fins with respect to the second and third hardmask fins; and
subsequent to forming the first mask, forming a second mask over the topography and selectively etching one or more of the third hardmask fins with respect to the first and second hardmask fins.
2. The method of claim 1 , wherein every other upper surface of the upper surfaces is always an upper surface of the second hardmask fins.
3. The method of claim 1 , wherein a pitch between adjacent first hardmask fins is substantially the same as a pitch between adjacent third hardmask fins.
4. The method of claim 3 , wherein the pitch between adjacent first hardmask fins and adjacent third hardmask fins is determined by directed self-assembly of the hardmask fins.
5. The method of claim 1 , wherein a pitch between adjacent first and third hardmask fins is approximately one-half a pitch between adjacent first hardmask fins.
6. The method of claim 1 , wherein a pitch between adjacent first and third hardmask fins is approximately 20 nm.
7. The method of claim 1 , further comprising: transferring a pattern of the hardmask fins to an underlying layer.
8. The method of claim 7 , wherein the underlying layer comprises features at two different pitches.
9. The method of claim 8 , wherein the two different pitches comprise a first pitch and a second pitch which is double the first pitch.
10. The method of claim 1 , wherein heights of the first, second and third hardmask fins in a direction orthogonal to the upper surfaces are different.
11. The method of claim 10 , wherein the height of the second hardmask fins is less than heights of the first and third hardmask fins.
12. The method of claim 1 , wherein the second hardmask fins comprise a spin-on material.
13. A method of manufacturing a semiconductor integrated circuit comprising:
forming a topography above a substrate, the topography comprising upper surfaces of first, second, and third hardmask fins, wherein:
upper surfaces of the first hardmask fins comprise a first composition;
upper surfaces of the second hardmask fins comprise a second composition;
upper surfaces of the third hardmask fins comprise a third composition;
the hardmask fins are formed in a plurality of repeatable blocks; and
the hardmask fins of each repeatable block are formed in a sequence of ABCB, where: A represents a first hardmask fin, B represents second hardmask fins, and C represents a third hardmask fin;
a pitch between adjacent first hardmask fins is substantially the same as a pitch between adjacent third hardmask fins; and
a pitch between adjacent first and third hardmask fins is approximately one-half a pitch between adjacent first hardmask fins;
forming a first mask over the topography and selectively etching one or more upper surfaces of the first hardmask fins with respect to upper surfaces of the second and third hardmask fins; and
subsequent to forming the first mask, forming a second mask over the topography and by selectively etching one or more of the third hardmask fins with respect to the first and second hardmask fins.
14. The method of claim 13 , wherein every other upper surface of the upper surfaces is always an upper surface of the second hardmask fins.
15. The method of claim 13 , wherein a pitch between adjacent first and third hardmask fins is approximately 20 nm.
16. The method of claim 13 , wherein the pitch between adjacent first hardmask fins and adjacent third hardmask fins is determined by directed self-assembly of the hardmask fins.
17. The method of claim 13 , further comprising: transferring a pattern of the hardmask fins to an underlying layer.
18. The method of claim 17 , wherein the underlying layer comprises features at two different pitches.
19. The method of claim 18 , wherein the two different pitches comprise a first pitch and a second pitch double the first pitch.
20. The method of claim 13 , wherein heights of the first, second and third hardmask fins in a direction orthogonal to the upper surfaces are different.
21. The method of claim 20 , wherein the height of the second hardmask fins is less than heights of the first and third hardmask fins.
22. The method of claim 13 , wherein the second hardmask fins comprise a spin-on material.