Automated focusing system for tracking specimen surface with a configurable focus offset
An auto-focusing system is disclosed. The system includes an illumination source. The system includes an aperture. The system includes a projection mask. The system includes a detector assembly. The system includes a relay system, the relay system being configured to optically couple illumination transmitted through the projection mask to an imaging system. The relay system also being configured to project one or more patterns from the projection mask onto a specimen and transmit an image of the projection mask from the specimen to the detector assembly. The system includes a controller including one or more processors configured to execute a set of program instructions. The program instructions being configured to cause the one or more processors to: receive one or more images of the projection mask from the detector assembly and determine quality of the one or more images of the projection mask.
1 . An auto-focusing system comprising:
an illumination source;
an aperture;
a projection mask;
a detector assembly, wherein the detector assembly comprises a two-dimensional camera;
a relay system, wherein the relay system is configured to optically couple illumination transmitted through the projection mask to an imaging system, wherein the relay system is configured to project one or more patterns from the projection mask onto a specimen disposed on a stage assembly of the imaging system and transmit an image of the projection mask from the specimen to the detector assembly; and
a controller including one or more processors, wherein the one or more processors are configured to execute a set of program instructions stored in non-transitory memory, wherein the program instructions are configured to cause the one or more processors to:
receive one or more images of the projection mask from the detector assembly; and
determine quality of the one or more images of the projection mask.
2 . The system of claim 1 , wherein the one or more processors are further configured to:
determine image quality of the one or more images of the projection mask based on applying one or more focus metrics to the one or more images of the projection mask.
3 . The system of claim 2 , wherein the one or more focus metrics comprise:
a through focus curve (TFC).
4 . The system of claim 1 , wherein the one or more processors are further configured to:
adjust a vertical position of the stage assembly of the imaging system in response to the determined image quality of the projection mask.
5 . The system of claim 4 , wherein the one or more processors are further configured to:
adjust the vertical position of the stage assembly of the imaging system to maintain a vertical position of the specimen at a peak position of a through focus curve (TFC).
6 . The system of claim 1 , wherein the two-dimensional camera comprises:
a tilted two-dimensional camera.
7 . The system of claim 1 , wherein the detector assembly further comprises:
a transparent plate, wherein the transparent plate is disposed in front of the two-dimensional camera and has a thickness that varies across the plate.
8 . The system of claim 1 , further comprising:
one or more optical elements, wherein the one or more optical elements comprise at least one of one or more lenses, one or more mirrors, or one or more beam splitters.
9 . The system of claim 1 , wherein the imaging system comprises at least one of an inspection system or an imaging-based metrology system.
10 . The system of claim 1 , wherein the specimen comprises a semiconductor wafer.
11 . A system comprising:
an imaging system;
an auto-focusing system comprising:
an illumination source;
an aperture;
a projection mask;
a detector assembly, wherein the detector assembly comprises a two-dimensional camera; and
a relay system, wherein the relay system is configured to optically couple the auto-focusing system to the imaging system, wherein the relay system is configured to project one or more patterns from the projection mask onto a specimen disposed on a stage assembly and transmit an image of the projection mask from the specimen back to the detector assembly of the auto-focusing system; and
a controller including one or more processors, wherein the one or more processors are configured to execute a set of program instructions stored in non-transitory memory, wherein the program instructions are configured to cause the one or more processors to:
receive one or more images of the projection mask from the detector assembly; and
determine quality of the one or more images of the projection mask.