IP Library › Granted Patent US 12,352,832
Granted Patent B2
US 12,352,832 · App. 18/161,145 · Granted Jul 8, 2025

Reducing angle error in angle sensor due to orthogonality drift over magnetic-field

Inventors: Samridh Jaiswal (London, GB); Paolo Campiglio (Arcueil, FR); Ronald Lehndorff (Mainz, DE); Yen Ting Liu (Hsinchu, TW)
Assignee: Allegro MicroSystems, LLC
G01R33/091G01B7/30G01R33/093G01R33/096G01R33/098G01R33/0052
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Quick Facts
Patent No.
US 12,352,832
App. No.
18/161,145
Granted
Jul 8, 2025
Kind
B2
Abstract

In one aspect, a method includes manufacturing a magnetic-field angle sensor on a wafer. The manufacturing includes forming a cosine bridge that includes forming a first magnetoresistance (MR) element. The manufacturing also includes forming a sine bridge that includes forming a second MR element. Forming the first MR element includes using a process to reduce orthogonality errors between the sine bridge and the cosine bridge caused by anisotropy present in magnetic material in the first MR element.

Claims (31)

1. A method for manufacturing a magnetic field sensor, the method comprising:

forming, on a substrate, a cosine bridge, the forming of the cosine bridge including forming a first magnetoresistance (MR) element, the first MR element being formed by: (i) depositing on the substrate 1/n of a total of a magnetic material of a first magnetic layer, (ii) rotating the substrate by 360°/n after depositing 1/n of the total of the magnetic material of magnetic layer, (iii) depositing on the substrate an additional 1/n of the total of the magnetic material of the first magnetic layer, (iv) rotating the substrate by 360°/n after depositing the additional 1/n of the total of the magnetic material of the first magnetic layer, wherein n is an integer greater than 2, and steps (iii), and (iv) are repeated until the total of the magnetic material of the first magnetic layer is deposited; and

forming, on the substrate, a sine bridge, the forming of the sine bridge including forming a second MR element.

2. The method of claim 1 , wherein:

the second MR element is formed by: (v) depositing on the substrate 1/m of a total of a magnetic material of a second magnetic layer, (vi) rotating the substrate by 360°/m after depositing 1/m of the total of the magnetic material of the second magnetic layer, and (vii) depositing on the substrate an additional 1/m of the total of the magnetic material of the second magnetic layer, (viii) rotating the substrate by 360°/m after depositing the additional 1/m of the total of the magnetic material of the second magnetic layer;

m is an integer greater than 2, and

steps (vii), and (viii) are repeated until the total of the magnetic material of the second magnetic layer is deposited.

3. The method of claim 1 , further comprising rotating the substrate after the total of the magnetic material of the first magnetic layer is deposited and performing magnetic annealing on the first magnetic layer while the substrate is being rotated.

4. The method of claim 1 , wherein the sine bridge and the cosine bridge each comprise at least four MR elements.

5. The method of claim 1 , wherein the first MR element and/or the second MR element is a giant magnetoresistance (GMR) elements.

6. The method of claim 1 , wherein the first MR element and/or the second MR element is a tunneling magnetoresistance (TMR) elements.

7. The method of claim 1 , wherein the magnetic material is ferromagnetic material.

8. The method of claim 1 , wherein the magnetic material is antiferromagnetic material.

9. A method for manufacturing a magnetic field sensor, the method comprising:

forming, on a substrate, a cosine bridge, the forming of the cosine bridge including forming a first magnetoresistance (MR) element, the first MR element being formed by: (i) depositing on the substrate 1/n of a total of a magnetic material of a first magnetic laver, (ii) rotating the substrate by a first predetermined angular distance after depositing 1/n of the total of the magnetic material of the first magnetic layer, (iii) depositing on the substrate an additional 1/n of the total of the magnetic material of the first magnetic layer, (iv) rotating the substrate by the first predetermined angular distance after depositing the additional 1/n of the total of the magnetic material of the first magnetic layer, wherein n is an integer greater than 2, the first predetermined angular distance is less than 360 degrees, and steps (iii), and (iv) are repeated until the total of the magnetic material of the first magnetic layer is deposited; and

forming, on the substrate, a sine bridge, the forming of the sine bridge including forming a second MR element.

10. The method of claim 9 , further comprising rotating the substrate after the total of the magnetic material of the first magnetic layer is deposited and performing magnetic annealing on the first magnetic layer while the substrate is being rotated.

11. The method of claim 9 , wherein the first MR element and/or the second MR element is a giant magnetoresistance (GMR) elements.

12. The method of claim 9 , wherein the first MR element and/or the second MR element is a tunneling magnetoresistance (TMR) elements.

13. The method of claim 9 , wherein the magnetic material is ferromagnetic material.

14. The method of claim 9 , wherein the magnetic material is antiferromagnetic material.

15. The method of claim 9 , wherein:

the second MR element is formed by: (v) depositing on the substrate 1/m of a total of a magnetic material of a second magnetic layer, (vi) rotating the substrate by a second predetermined angular distance after depositing 1/m of the total of the magnetic material of the second magnetic layer, and (vii) depositing on the substrate an additional 1/m of the total of the magnetic material of the second magnetic layer, (viii) rotating the substrate by the second predetermined angular distance after depositing the additional 1/m of the total of the magnetic material of the second magnetic layer,

m is an integer greater than 2,

the second predetermined angular distance is less than 360 degrees; and

steps (vii), and (viii) are repeated until the total of the magnetic material of the second magnetic layer is deposited.

16. A method for manufacturing a magnetic field sensor, the method comprising:

forming, on a substrate, a cosine bridge, the forming of the cosine bridge including forming a first magnetoresistance (MR) element the first MR element being formed by: depositing on the substrate a magnetic material of a first magnetic layer, rotating the substrate after depositing the magnetic material of the first magnetic layer, performing magnetic annealing of the first magnetic layer while the substrate is rotating, and setting a magnetization direction of a reference layer of the first MR element after the magnetic annealing is completed; and

forming, on the substrate, a sine bridge, the forming of the sine bridge including forming a second MR element.

17. The method of claim 16 , wherein the first MR element and/or the second MR element is a giant magnetoresistance (GMR) elements.

18. The method of claim 16 , wherein the first MR element and/or the second MR element is a tunneling magnetoresistance (TMR) elements.

Assignments (2)
PATENT SECURITY AGREEMENT Recorded Jun 22, 2023
From: ALLEGRO MICROSYSTEMS, LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS THE COLLATERAL AGENT
Reel/Frame 064068/0459 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2023
From: JAISWAL, SAMRIDH; CAMPIGLIO, PAOLO; LEHNDORFF, RONALD; LIU, YEN TING; ALLEGRO MICROSYSTEMS GERMANY GMBH; ALLEGRO MICROSYSTEMS FRANCE SAS; ALLEGRO MICROSYSTEMS EUROPE LIMITED; ALLEGRO MICROSYSTEMS BUSINESS DEVELOPMENT, INC.
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 062526/0647 →
Continuity (1)
Related Publication 20240255592A1 · Aug 1, 2024
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