Chemical mechanical polishing pad with fluorinated polymer and multimodal groove pattern

1. A polishing pad suitable for chemical mechanical polishing comprising:

a polishing layer including a polyurea having a soft phase and a hard phase, the soft phase being a copolymer of aliphatic fluorine-free species and a fluorinated aliphatic species, and hard phase being formed from diisocyanate containing segments and an amine curative agent,

wherein the polishing layer has a top surface having a groove pattern,

the groove pattern comprises a plurality of first grooves having a first groove cross-section, the plurality of first grooves defining a plurality of regions between adjacent first grooves; and, in a portion of the plurality of region between adjacent first grooves, a plurality of second grooves having a second groove cross-section, wherein the second groove cross-section is less than 50 percent of the first groove cross-section,

wherein the polishing layer is further characterized by having a specific gravity of at least 1.05 grams per cubic centimeter.

2. The polishing pad of claim 1 having a specific gravity of 1.1 grams per cubic centimeter or more.

3. The polishing pad of claim 1 that is non-porous.

4. The polishing pad of claim 1 wherein a pitch of the first grooves is from 2.5 to 15 times a width of the first grooves and a pitch of the second grooves is from 1.5 to 10 times the width of the second grooves.

5. The polishing pad of claim 1 wherein each of the plurality of regions between adjacent first grooves comprises the plurality of the second grooves.

6. The polishing pad of claim 1 wherein the plurality of the second grooves in the region between adjacent first grooves comprises at least three of the second grooves.

7. The polishing pad of claim 1 wherein the polishing layer is hydrophilic during polishing in shear conditions.