Substrate processing method and substrate processing system

1. A substrate processing method, comprising:

removing a dissolved gas in a processing liquid;

forming a liquid film of the processing liquid covering a surface of a substrate, by supplying, onto the surface of the substrate, the processing liquid from which the dissolved gas is removed;

carrying the substrate having the liquid film formed thereon into a processing vessel; and

drying the surface of the substrate by flowing a processing fluid into the processing vessel while maintaining an internal pressure of the processing vessel, in which the substrate having the liquid film formed thereon is accommodated, at a pressure allowing the processing fluid to be maintained in a supercritical state, to replace the processing liquid covering the surface of the substrate with the processing fluid, and, then, by vaporizing the processing fluid.

2. The substrate processing method of claim 1 ,

wherein the removing of the dissolved gas comprises heating the processing liquid to a temperature less than a boiling temperature of the processing liquid.

3. The substrate processing method of claim 2 ,

wherein the removing of the dissolved gas comprises heating the processing liquid stored in a vessel to the temperature less than the boiling temperature of the processing liquid, while maintaining an inside of the vessel in which the processing liquid is stored in an atmosphere of an inert gas.

4. The substrate processing method of claim 3 ,

wherein the inert gas is a nitrogen gas or an argon gas.

5. The substrate processing method of claim 1 ,

wherein the removing of the dissolved gas comprises decompressing a vessel in which the processing liquid is stored.

6. The substrate processing method of claim 1 ,

wherein the removing of the dissolved gas comprises:

generating a bubble in the processing liquid by applying ultrasonic vibrations to the processing liquid; and

removing the bubble from the processing liquid.

7. The substrate processing method of claim 6 ,

wherein the generating of the bubble in the processing liquid and the removing of the bubble from the processing liquid are performed by using an inline degassing mechanism provided in a circulation path connected to a vessel in which the processing liquid is stored, while flowing the processing liquid into the circulation path.

8. The substrate processing method of claim 1 , further comprising:

maintaining an atmosphere of a space through which the substrate having the liquid film of the processing liquid formed thereon passes to an atmosphere of an inert gas during a period from an end of the forming of the liquid film to an end of the carrying of the substrate into the processing vessel.

9. The substrate processing method of claim 8 ,

wherein the inert gas is a nitrogen gas or an argon gas.

10. The substrate processing method of claim 1 , further comprising:

performing a chemical liquid processing on the substrate prior to the forming of the liquid film.

11. The substrate processing method of claim 10 ,

wherein the chemical liquid processing is an etching processing.

12. The substrate processing method of claim 11 ,

wherein a pattern having multiple grooves is formed on the substrate by the etching processing.

13. A substrate processing system, comprising:

a liquid processing unit configured to perform a liquid film forming process on a substrate;

a processing liquid supplying mechanism configured to supply a processing liquid used in the liquid processing unit, the processing liquid supplying mechanism including a degassing device configured to remove a dissolved gas from the processing liquid;

a supercritical drying unit configured to perform a supercritical drying processing on the substrate;

a transfer device configured to transfer the substrate from the liquid processing unit to the supercritical drying unit; and

a controller configured to control an operation of the substrate processing system to perform a substrate processing method as claimed in claim 1 .