Short-wave infrared based imaging
A system includes a laparoscope including a first port, a second port, and an optical system. The optical system includes a first port coupling, a shortwave infrared (SWIR) sensor coupling configured to couple to a SWIR sensor, and a visible-light sensor coupling configured to couple to a visible-light sensor. The optical system is configured to optically couple to at least the second port of the laparoscope via the first port coupling. The optical system is configured to receive a detection SWIR beam from the second port and direct at least a portion of the detection SWIR beam to the SWIR sensor coupling. The optical system is further configured to receive a detection visible-light beam from the second port and direct at least a portion of the detection visible-light beam to the visible-light sensor coupling.
1 . A system comprising:
a laparoscope including a first port and a second port;
an optical system comprising a first port coupling, a shortwave infrared (SWIR) sensor coupling configured to couple to a SWIR sensor, and a visible-light sensor coupling configured to couple to a visible-light sensor,
wherein the optical system is configured to optically couple to at least the second port of the laparoscope via the first port coupling,
wherein the optical system is configured to receive a detection SWIR beam from the second port and direct at least a portion of the detection SWIR beam to the SWIR sensor coupling, and
wherein the optical system is further configured to receive a detection visible-light beam from the second port and direct at least a portion of the detection visible-light beam to the visible-light sensor coupling,
wherein the laparoscope is configured to receive an inspection visible-light beam via the first port, and an inspection SWIR beam via one of the first port and the second port; and
wherein the optical system further includes:
a SWIR source coupling configured to couple to a SWIR source and receive the inspection SWIR beam via the SWIR source coupling;
a first polarizer configured to receive the inspection SWIR beam, and transmit a polarized portion of the inspection SWIR beam having a first polarization;
a first optical element downstream from the first polarizer and configured to receive the inspection SWIR beam and transmit at least a portion of the inspection SWIR beam having the first polarization;
a second optical element configured to receive the inspection SWIR beam and reflect at least a portion of the inspection SWIR beam out of the optical system via the first port coupling and the second port of the laparoscope;
wherein the second optical element is configured to receive the detection visible-light beam and the detection SWIR beam via the first port coupling and the second port, transmit at least a portion of the detection visible-light beam, and reflect at least a portion of the detection SWIR beam.
2 . The system of claim 1 , wherein the detection visible-light beam is generated based on an interaction between a target tissue and at least a portion of the inspection visible-light, and wherein the detection SWIR beam is generated based on an interaction between the target tissue and at least a portion of the inspection SWIR beam.
3 . The system of claim 1 , wherein the first optical element is configured to receive the detection SWIR beam reflected by the second optical element, and reflect at least a portion of the detection SWIR beam having a second polarization.
4 . The system of claim 3 , further including a second polarizer configured to receive the detection SWIR beam reflected by the first optical element, and transmit at least a portion of the detection SWIR beam having the second polarization.
5 . The system of claim 4 , wherein the detection SWIR beam is directed from the second polarizer out of the optical system via the SWIR sensor coupling.
6 . The system of claim 1 , wherein the detection visible-light beam is directed from the second optical element out of the optical system via the visible-light sensor coupling.
7 . The system of claim 1 , wherein the inspection SWIR beam and the detection SWIR beam have a wavelength between 0.9 microns and 2 microns.
8 . The system of claim 1 , wherein the optical system includes:
a second port coupling configured to couple to the first port of the laparoscope; and
a visible-light source coupling configured to couple to a visible-light source, and receive the inspection visible-light beam via the visible-light source coupling.
9 . The system of claim 1 , wherein the laparoscope includes:
a first optical path configured to optically couple the first port with an output aperture of the laparoscope, wherein the inspection visible-light beam and the inspection SWIR beam are configured to travel along the first optical path; and
a second optical path configured to optically couple the output aperture with the second port, wherein detection visible-light beam and the detection SWIR beam are configured to travel along the second optical path.
10 . A system comprising:
a laparoscope including a first port and a second port;
an optical system comprising a first port coupling, a shortwave infrared (SWIR) sensor coupling configured to couple to a SWIR sensor, and a visible-light sensor coupling configured to couple to a visible-light sensor,
wherein the optical system is configured to optically couple to at least the second port of the laparoscope via the first port coupling,
wherein the optical system is configured to receive a detection SWIR beam from the second port and direct at least a portion of the detection SWIR beam to the SWIR sensor coupling, and
wherein the optical system is further configured to receive a detection visible-light beam from the second port and direct at least a portion of the detection visible-light beam to the visible-light sensor coupling,
wherein the laparoscope is configured to receive an inspection visible-light beam via the first port, and an inspection SWIR beam via one of the first port and the second port; and
wherein the optical system further includes:
a SWIR source coupling configured to couple to a SWIR source and receive the inspection SWIR beam via the SWIR source coupling;
a second port coupling configured to couple to the first port of the laparoscope;
a visible-light source coupling configured to couple to a visible-light source, and receive the inspection visible-light beam via the visible-light source coupling; and
a first optical sub-system coupled to the second port of the laparoscope, the first optical sub-system including:
a first optical element configured to receive the detection visible-light beam and the detection SWIR beam via the first port coupling and the second port, transmit at least a portion of the detection visible-light beam, and reflect at least a portion of the detection SWIR beam; and
a polarizer configured to receive the detection SWIR beam reflected by the first optical element and transmit at least a portion of the detection SWIR beam having a first polarization.
11 . The system of claim 10 , wherein detection SWIR beam is directed from the polarizer out of the first optical sub-system via the SWIR sensor coupling.
12 . The system of claim 10 , wherein at least a portion of the detection visible-light beam is directed from the first optical element out of the first optical sub-system via the visible-light sensor coupling.
13 . The system of claim 10 , wherein the optical system includes a second optical sub-system coupled to the first port of the laparoscope and including a second optical element,
wherein the second optical element is configured to receive the inspection visible-light beam via the visible-light source coupling and reflect at least a portion of the inspection visible-light beam,
wherein the inspection visible-light beam is directed out of the second optical sub-system via the second port coupling and the first port of the laparoscope.
14 . The system of claim 13 , wherein the second optical element is configured receive the inspection SWIR beam via the SWIR source coupling and transmit at least a portion of the inspection SWIR beam, wherein the inspection SWIR beam is directed from the second optical element out of the second optical system sub-system via the second port coupling and enters the laparoscope via the first port.
15 . A system comprising:
a laparoscope including a first port and a second port;
an optical system comprising a first port coupling, a shortwave infrared (SWIR) sensor coupling configured to couple to a SWIR sensor, and a visible-light sensor coupling configured to couple to a visible-light sensor,
wherein the optical system is configured to optically couple to at least the second port of the laparoscope via the first port coupling,
wherein the optical system is configured to receive a detection SWIR beam from the second port and direct at least a portion of the detection SWIR beam to the SWIR sensor coupling, and
wherein the optical system is further configured to receive a detection visible-light beam from the second port and direct at least a portion of the detection visible-light beam to the visible-light sensor coupling,
wherein the laparoscope is configured to receive an inspection visible-light beam via the first port, and an inspection SWIR beam via one of the first port and the second port; and wherein the laparoscope further includes:
a first optical path configured to optically couple the first port with an output aperture of the laparoscope, wherein the inspection visible-light beam is configured to travel along the first optical path; and
a second optical path configured to optically couple the output aperture with the second port, wherein the inspection SWIR beam, the detection visible-light beam, and the detection SWIR beam are configured to travel along the second optical path.