Semiconductor device
A semiconductor device includes: a split-gate transistor connected between a drain electrode (output electrode OUT) and a ground electrode and having a plurality of individually controllable channel regions; an active clamp circuit configured to limit the output voltage VOUT appearing at the output electrode to a clamp voltage or below; and a gate control circuit configured to raise the ON resistance of the split-gate transistor gently (or stepwise) after the split-gate transistor is switched from the ON state to the OFF state before the active clamp circuit limits the output voltage VOUT.
1. A semiconductor device, comprising:
a split-gate transistor connected between an output electrode and a ground electrode, the split-gate transistor having a plurality of individually controllable channel regions;
an active clamp circuit configured to limit an output voltage appearing at the output electrode to a clamp voltage or below; and
a gate control circuit configured to raise an ON resistance of the split-gate transistor gently or stepwise after the split-gate transistor is switched from an ON state to an OFF state before the active clamp circuit limits the output voltage.
2. The semiconductor device according to claim 1 , wherein
the split-gate transistor includes a first transistor and a second transistor configured to be connected in parallel between the output electrode and the ground electrode, and
the gate control circuit controls gates of the first and second transistors respectively so as to keep the first and second transistors on in the ON state and keep the first and second transistors off in the OFF state.
3. The semiconductor device according to claim 2 , wherein
the gate control circuit decreases a gate-source voltage of the second transistor gently after the split-gate transistor is switched from the ON state to the OFF state before the active clamp circuit limits the output voltage.
4. The semiconductor device according to claim 3 , wherein
the gate control circuit includes:
a third transistor connected between the gate and a source of the second transistor and configured to be turned on and off according to an internal node voltage in the active clamp circuit; and
a capacitor connected between a gate and a source of the third transistor.
5. The semiconductor device according to claim 3 , wherein
the gate control circuit includes a current source connected between the gate and a source of the second transistor and configured to be turned on and off according to an internal node voltage in the active clamp circuit.
6. The semiconductor device according to claim 4 , wherein
the active clamp circuit includes:
a Zener diode configured to have a cathode connected to a drain of the first transistor; and
a diode configured to have
an anode connected to an anode of the Zener diode and
a cathode connected the gate of the first transistor or to a gate of a fourth transistor connected between the gate and the drain of the first transistor.
7. The semiconductor device according to claim 6 , wherein
the internal node voltage is a cathode voltage of the diode or a division voltage thereof.
8. An electronic device, comprising:
the semiconductor device according to claim 1 ; and
a load connected to the semiconductor device.
9. The electronic device according to claim 8 , wherein
the load is an inductive load.
10. A vehicle comprising the electronic device according to claim 8 .