IP Library › Granted Patent US 12,652,762
Granted Patent B2
US 12,652,762 · App. 18/294,158 · Granted Jun 9, 2026

Method for manufacturing wiring board, and wiring board

Inventors: Kei Togasaki (Tokyo, JP); Kazuyuki Mitsukura (Tokyo, JP); Masaya Toba (Tokyo, JP); Kenichi Iwashita (Tokyo, JP); Keishi Ono (Tokyo, JP); Mao Narita (Tokyo, JP)
H05K3/10C25D3/38C25D5/022C25D5/605C25D7/123H05K1/02H05K2203/11H10W70/05H10W70/66
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Quick Facts
Patent No.
US 12,652,762
App. No.
18/294,158
Granted
Jun 9, 2026
Kind
B2
Abstract

A method for manufacturing a wiring board, including: forming a resist layer on a seed layer comprising a metal provided on a support body; forming a pattern including an opening to which the seed layer is exposed in the resist layer by light exposure and development of the resist layer; and forming a copper plating layer on the seed layer exposed into the opening by electrolytic plating, in this order. The arithmetic mean roughness Ra of the surface of the seed layer on a side opposite to the support body is 0.05 μm or more and 0.30 μm or less.

Claims (19)

1 . A method for manufacturing a wiring board, comprising:

forming a resist layer on a seed layer comprising a metal provided on a support body;

forming a pattern including an opening to which the seed layer is exposed in the resist layer by light exposure and development of the resist layer; and

forming a copper plating layer on the seed layer exposed into the opening by electrolytic plating, in this order,

wherein arithmetic mean roughness Ra of a surface of the seed layer on a side opposite to the support body is adjusted in a range of 0.05 um or more and 0.30 um or less such that a number of black portions with a width of less than 0.3 um observed in the copper plating layer in a vicinity of an interface between the seed layer and the copper plating layer is 9.0 or less per a width of 1 μm in a direction parallel to a main surface of the support body.

2 . The method according to claim 1 , further comprising providing the seed layer on the support body by electroless plating.

3 . The method according to claim 2 , further comprising roughening a surface of the support body,

wherein the seed layer is provided on the roughened surface of the support body.

4 . The method according to claim 3 , wherein the surface of the support body is roughened such that surface roughness Ra of the surface of the support body is 0.05 um or more and 0.30 um or less.

5 . The method according to claim 1 , further comprising providing the seed layer by laminating a metal foil on the support body.

6 . The method according to claim 1 , wherein a thickness of the seed layer is 200 nm or more and 1000 nm or less.

7 . The method according to claim 1 , wherein the resist layer before the light exposure comprises a binder polymer comprising a (meth) acrylic acid as a monomer unit.

8 . The method according to claim 7 , wherein the binder polymer further comprises at least one of (meth) acrylic acid benzyl ester or a derivative thereof, or styrene or a styrene derivative, as a monomer unit.

9 . The method according to claim 1 , wherein the resist layer before the light exposure comprises a dye.

10 . A wiring board comprising:

a support body; and

wiring including a seed layer comprising a metal provided on the support body, and a copper plating layer formed by electrolytic plating,

wherein arithmetic mean roughness Ra of a surface of the seed layer on a side opposite to the support body is 0.05 um or more and 0.30 um or less, and

wherein a number of black portions with a width of less than 0.3 um observed in the copper plating layer in a vicinity of an interface between the seed layer and the copper plating layer is 9.0 or less per a width of 1 μm in a direction parallel to a main surface of the support body.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2024
From: TOGASAKI, KEI; MITSUKURA, KAZUYUKI; TOBA, MASAYA; IWASHITA, KENICHI; ONO, KEISHI; NARITA, MAO
To: RESONAC CORPORATION
Reel/Frame 067231/0446 →
Priority Claims (1)
WO PCT/JP2021/028603 · Aug 2, 2021 · international
Continuity (1)
Related Publication 20240341039A1 · Oct 10, 2024
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