Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy
Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
1. A method of operating a photothermal infrared microscope, the method comprising:
a) illuminating a region of a sample with a pump beam of infrared radiation;
b) dividing a beam of probe radiation onto at least two paths, the at least two paths including a first path towards a sample and a second path towards a reference reflector;
c) directing probe radiation on the first path to illuminate the sample at least partially overlapping the infrared illuminated region of the sample, wherein the probe radiation interacts with at least two surfaces of the sample to create interfering radiation;
d) collecting the interfering radiation from the sample as collected probe light;
e) recombining the collected probe light with probe radiation reflected from the second path to form recombined light;
f) dividing the recombined light between at least two detectors;
g) using signals from the at least two detectors to generate a signal indicative of infrared absorption by the sample that at least partially suppresses effects of thin film interference from the interfering radiation.
2. The method of claim 1 wherein the two detectors are substantially in quadrature.
3. The method of claim 1 in which the signals from the at least two detectors are combined in at least one of a sum of squares and a root-mean-square sum.
4. The method of claim 3 in which the combined signals are demodulated by a lock-in amplifier.
5. The method of claim 3 in which the combined signals are analyzed by time domain demodulation.
6. The method of claim 1 in which the signals from the at least two detectors are demodulated with a lock-in amplifier and then combined in a root-mean-square sum.
7. The method of claim 1 , wherein (c) includes creating interfering radiation in at least one of forward and backward directions.
8. The method of claim 1 , wherein the recombined light is divided between the at least two detectors at (f) based upon polarization.
9. The method of claim 1 , further comprising inserting a reflector at the probe beam path and
illuminating the sample with a light source to obtain an optical image of the sample.
10. The method of claim 1 , further comprising generating a quadrature Lissajous figure and corresponding dynamic correction factors based upon the composite photothermal signal.
11. The method of claim 1 , wherein the composite photothermal signal that at least partially suppresses effects of thin film interference from the interfering radiation has a signal- to-noise ratio of at least 1000:1.
12. The method of claim 1 , further comprising focusing probe radiation with a complementary focusing element on the second path to the reference reflector.
13. The method of claim 1 wherein probe radiation reflected from the reference reflector has an intensity of at least ten times that of an intensity of probe radiation reflected from a secondary reflection from the sample.
14. The apparatus of claim 13 , further comprising a brightfield subsystem including a brightfield light source and a reflector, wherein the brightfield subsystem is configured to be inserted along the probe beam path to illuminate the sample and obtain a brightfield image thereof.
15. The apparatus of claim 13 , further comprising a complementary focusing optic along the second path.
16. The apparatus of claim 13 wherein the two detectors are substantially in quadrature.
17. The method of claim 1 , further comprising:
(h) generating a signal indicative of infrared absorption by the sample.
18. An apparatus for photothermal infrared microscopy, the apparatus comprising:
an infrared light source configured to illuminate region of a sample with infrared radiation;
a probe beam source configured to generate a beam of probe radiation having a wavelength lower than the wavelength of the infrared radiation;
a beam splitter arranged to divide the probe beam of radiation onto at least two paths, the at least two paths including a first path towards the sample and a second path towards a reference reflector, wherein the probe beam on the first path will illuminate the sample at a region at least partially overlapping the infrared illuminated region of the sample and interact with at least two surfaces of the sample to create interfering radiation;
a collection optic arranged to collect probe light from the sample, including the interfering radiation;
a beam combiner configured to recombine light reflected off the reference reflector with probe light collected from the sample;
at least two detectors;
a beam splitter configured to divide the recombined light between the at least two detectors; and
a signal processor that combines signals from the at least two detectors to generate a signal indicative of infrared absorption by the sample while at least partially suppressing effects of thin film interference from the interfering radiation.
19. The apparatus of claim 18 wherein the processor is configured to combine the signals from the at least two detectors in a root-mean-square sum.
20. The apparatus of claim 19 further comprising a lock-in amplifier configured to demodulate the signal from each of the at least two detectors.
21. The apparatus of claim 20 wherein the lock-in amplifier is configured to perform time domain demodulation based on an operating frequency of the pump beam of infrared radiation.
22. The apparatus of claim 21 , wherein the beam splitter configured to divide a recombined beam between the at least two detectors is a polarizing beam splitter.