Force, deflection, resistance, and temperature testing system and method of use
A method of use of the testing system having an electrical interconnect attached to an electrical interconnect testing device, a device under test aligned with the electrical interconnect, and an environmental chamber. The method comprising positioning the environmental chamber such that the device under test is operably contained within the environmental chamber, setting the environmental chamber to a first temperature, pressing down on the device under test with a plurality of different levels of force, or to a plurality of different positions, and taking at least one measurement of at least one electrical property while the device under test is pressed down. In various arrangements, the method of use further including the steps of adjusting the temperature within the environmental chamber to a second temperature and repeating the steps of pressing down on the device under test and taking at least one measurement of at least one electrical property.
1 . A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect;
the electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test;
aligning the device under test with the electrical interconnect;
providing an environmental chamber;
pressing the device under test into the electrical interconnect with a plurality of different levels of force while the environmental chamber is at a first temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is set to the first temperature.
2 . The method of claim 1 , further comprising:
setting the environmental chamber to a second temperature;
pressing the device under test into the electrical interconnect with the plurality of different levels of force while the environmental chamber is at the second temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is at the second temperature.
3 . The method of claim 1 , further comprising the step of taking a position measurement when the device under test is pressed into the electrical interconnect with the plurality of different levels of force.
4 . The method of claim 1 , wherein the at least one electrical property is one of resistance, capacitance, leakage, or inductance.
5 . The method of claim 1 wherein the measurement of the at least one electrical property is taken on one of the plurality of contact points of the electrical interconnect.
6 . The method of claim 1 wherein the measurement of the at least one electrical property is taken on a combination of the plurality of contact points of the electrical interconnect.
7 . The method of claim 1 wherein the first temperature is significantly above ambient temperature or significantly below ambient temperature.
8 . The method of claim 1 wherein the step of pressing the device under test into the electrical interconnect with the plurality of different levels of force while the environmental chamber is at the first temperature is repeated a number of times; and
wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is at the first temperature is repeated a number of times.
9 . The method of claim 1 wherein the plurality of different levels of force are determined by a testing recipe.
10 . A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect;
the electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test;
aligning the device under test with the electrical interconnect;
providing an environmental chamber;
pressing the device under test into the electrical interconnect with a plurality of different levels of force while the environmental chamber is at a first temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is set to the first temperature;
pressing the device under test into the electrical interconnect with the plurality of different levels of force while the environmental chamber is at a second temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is set to the second temperature.
11 . The method of claim 10 , further comprising the step of taking a position measurement when the device under test is pressed into the electrical interconnect with the plurality of different levels of force.
12 . The method of claim 10 , wherein the at least one electrical property is one of resistance, capacitance, leakage, or inductance.
13 . The method of claim 10 wherein the measurement of the at least one electrical property is taken on one of the plurality of contact points of the electrical interconnect.
14 . The method of claim 10 wherein the measurement of the at least one electrical property is taken on a combination of the plurality of contact points of the electrical interconnect.
15 . The method of claim 10 wherein the first temperature is significantly above ambient temperature or significantly below ambient temperature.
16 . The method of claim 10 wherein the second temperature is significantly above ambient temperature or significantly below ambient temperature.
17 . The method of claim 10 wherein the first temperature is significantly above ambient temperature and the second temperature is significantly below ambient temperature.
18 . The method of claim 10 wherein the step of pressing the device under test into the electrical interconnect with the plurality of different levels of force while the environmental chamber is at the first temperature is repeated a number of times; and wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is at the first temperature is repeated a number of times.
19 . The method of claim 10 wherein the step of pressing the device under test into the electrical interconnect with the plurality of different levels of force while the environmental chamber is at the second temperature is repeated a number of times; and wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed with the plurality of different levels of force and the environmental chamber is at the second temperature is repeated a number of times.
20 . The method of claim 10 wherein the plurality of different levels of force are determined by a testing recipe.
21 . A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect;
the electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test;
aligning the device under test with the electrical interconnect;
providing an environmental chamber;
pressing the device under test into the electrical interconnect to a plurality of different positions while the environmental chamber is at a first temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is set to the first temperature.
22 . The method of claim 21 , further comprising:
setting the environmental chamber to a second temperature;
pressing the device under test into the electrical interconnect to the plurality of different positions while the environmental chamber is at the second temperature; and
taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is at the second temperature.
23 . The method of claim 21 , wherein the at least one electrical property is one of resistance, capacitance, leakage, or inductance.
24 . The method of claim 21 wherein the measurement of the at least one electrical property is taken on one of the plurality of contact points of the electrical interconnect.
25 . The method of claim 21 wherein the measurement of the at least one electrical property is taken on a combination of the plurality of contact points of the electrical interconnect.
26 . The method of claim 21 wherein the first temperature is significantly above ambient temperature or significantly below ambient temperature.
27 . The method of claim 21 wherein the step of pressing the device under test into the electrical interconnect to the plurality of different positions while the environmental chamber is at the first temperature is repeated a number of times; and wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is at the first temperature is repeated a number of times.
28 . The method of claim 21 wherein the plurality of different positions are determined by a testing recipe.
29 . A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect;
the electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test;
aligning the device under test with the electrical interconnect;
providing an environmental chamber;
pressing the device under test into the electrical interconnect to a plurality of different positions while the environmental chamber is at a first temperature;
taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is set to the first temperature;
pressing the device under test into the electrical interconnect to a plurality of different positions while the environmental chamber is at a second temperature;
taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is set to the second temperature.
30 . The method of claim 29 , wherein the at least one electrical property is one of resistance, capacitance, leakage, or inductance.
31 . The method of claim 29 wherein the measurement of the at least one electrical property is taken on one of the plurality of contact points of the electrical interconnect.
32 . The method of claim 29 wherein the measurement of the at least one electrical property is taken on a combination of the plurality of contact points of the electrical interconnect.
33 . The method of claim 29 wherein the first temperature is significantly above ambient temperature or significantly below ambient temperature.
34 . The method of claim 29 wherein the second temperature is significantly above ambient temperature or significantly below ambient temperature.
35 . The method of claim 29 wherein the first temperature is significantly above ambient temperature and the second temperature is significantly below ambient temperature.
36 . The method of claim 29 wherein the step of pressing the device under test into the electrical interconnect to the plurality of different positions while the environmental chamber is at the first temperature is repeated a number of times; and wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is at the first temperature is repeated a number of times.
37 . The method of claim 29 wherein the step of pressing the device under test into the electrical interconnect to the plurality of different positions while the environmental chamber is at the second temperature is repeated a number of times; and wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed to the plurality of different positions and the environmental chamber is at the second temperature is repeated a number of times.
38 . The method of claim 29 wherein the plurality of different positions are determined by a testing recipe.
39 . A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test;
providing an environmental chamber;
providing a testing recipe;
adjusting the environmental chamber to a first temperature according to the testing recipe;
pressing the device under test into the electrical interconnect testing device according to the testing recipe while the environmental chamber is at the first temperature;
taking at least one measurement of at least one electrical property while the device under test is pressed into the electrical interconnect according to the testing recipe and the environmental chamber is at the first temperature.
40 . The method of claim 39 , wherein the testing recipe controls whether the device under test is pressed into the electrical interconnect testing device with a plurality of different levels of force or to a plurality of different positions; and
wherein the testing recipe determines the plurality of different levels of force or the plurality of different positions.
41 . The method of claim 39 , wherein the testing recipe controls whether the at least one measurement taken of is resistance, capacitance, leakage, or inductance.
42 . The method of claim 39 , further comprising:
adjusting the environmental chamber to a second temperature according to the testing recipe;
pressing the device under test into the electrical interconnect testing device according to the testing recipe while the environmental chamber is at the second temperature;
taking at least one measurement of at least one electrical property while the device under test is pressed into the electrical interconnect according to the testing recipe and the environmental chamber is at the second temperature.
43 . The method of claim 39 , further comprising:
wherein the step of pressing the device under test into the electrical interconnect is repeated a number of times according to the testing recipe;
wherein the step of taking at least one measurement of at least one electrical property while the device under test is pressed into the electrical interconnect is repeated a number of times according to the testing recipe.