IP Library Granted Patent US 12,563,777
Granted Patent B2
US 12,563,777 · App. 18/320,480 · Granted Feb 24, 2026

Complementary field effect transistor with oblique conductive through substrate layer

Inventors: Hsin-Chih Wang (Hsinchu, TW); Yu-Tien Shen (Hsinchu, TW); Yu-Chen Chang (Hsinchu, TW)
Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
H10D30/6729H10D30/014H10D30/43H10D30/6735H10D30/6757H10D62/121H10D64/017H10D84/017H10D84/0186H10D84/038H10D84/85
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Quick Facts
Patent No.
US 12,563,777
App. No.
18/320,480
Granted
Feb 24, 2026
Kind
B2
Abstract

A device includes: a complementary transistor including: a first transistor having a first source/drain region; and a second transistor above the first transistor in a vertical direction, and having a second source/drain region, the second transistor being offset from the first transistor in a first direction that is perpendicular to the vertical direction; a first source/drain contact electrically coupled to the first source/drain region; a second source/drain contact electrically coupled to the second source/drain region; and an interconnect structure electrically coupled to the first source/drain contact and the second source/drain contact, and including an oblique portion that extends from the first source/drain contact to the second source/drain contact at an offset angle from the vertical direction.

Claims (38)

1 . A device comprising:

a complementary transistor including:

a first transistor having a first source/drain region; and

a second transistor above the first transistor in a vertical direction, and having a second source/drain region, the second transistor being offset from the first transistor in a first direction that is perpendicular to the vertical direction;

a first source/drain contact electrically coupled to the first source/drain region;

a second source/drain contact electrically coupled to the second source/drain region; and

an interconnect structure electrically coupled to the first source/drain contact and the second source/drain contact, and including an oblique portion that extends from the first source/drain contact to the second source/drain contact at an offset angle from the vertical direction.

2 . The device of claim 1 , wherein the interconnect structure further includes a vertical portion that extends through the first source/drain contact.

3 . The device of claim 1 , wherein the oblique portion is a different material than the first source/drain contact.

4 . The device of claim 3 , wherein the oblique portion is ruthenium.

5 . The device of claim 1 , further comprising a metal-to-metal interface between the second source/drain contact and the oblique portion.

6 . The device of claim 1 , wherein the offset angle is in a range of about 10 degrees to about 40 degrees.

7 . The device of claim 1 , wherein the offset angle is in a range of about 40 degrees to about 70 degrees.

8 . The device of claim 1 , wherein one of the first and second source/drain regions is N-type and the other of the first and second source/drain regions is P-type.

9 . The device of claim 1 , wherein the first source/drain contact is a backside source/drain contact and the second source/drain contact is a frontside source/drain contact.

10 . The device of claim 1 , wherein the oblique portion is cylinder shaped.

11 . A device comprising:

a first source/drain contact electrically coupled to a first source/drain region;

a second source/drain contact electrically coupled to a second source/drain region; and

an interconnect structure electrically coupled to the first source/drain contact and the second source/drain contact, the interconnect structure includes an oblique portion that extends from the first source/drain contact to the second source/drain contact at an offset angle from the vertical direction.

12 . The device of claim 11 , wherein the oblique portion has a cylindrical shape.

13 . The device of claim 11 , wherein the oblique portion has a conical shape.

14 . The device of claim 11 , wherein the oblique portion is tapered.

15 . The device of claim 11 , wherein the first source/drain contact is a backside source/drain contact and the second source/drain contact is a frontside source/drain contact.

16 . The device of claim 11 , wherein:

the first source/drain contact is made of a first material;

the second source/drain contact is made of a second material; and

the oblique portion of the interconnect structure is made of a third material different from the first material and the second material.

17 . The device of claim 16 , wherein the first material and the second material are the same.

18 . A device, comprising:

a structure of stacked layers including a first side and a second side opposite to the first side;

a first transistor within the structure of stacked layers, the first transistor including a first source/drain region;

a first source/drain contact electrically coupled to the first source/drain region;

a second transistor within the structure of stacked layers, the second transistor including a second source/drain region;

a second source/drain contact electrically coupled to the second source/drain region; and

an interconnect structure in the structure of stacked layers and electrically coupled to the first source/drain contact and the second source/drain contact, the interconnect structure includes an oblique portion that extends through the structure of stacked layers from the first source/drain contact to the second source/drain contact at an offset angle from the vertical direction, and the angle is transverse to the first side and the second side of the structure of stacked layers.

19 . The device of claim 18 , wherein the oblique portion is tapered.

20 . The device of claim 18 , wherein the oblique portion has a cylindrical shape.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2023
From: WANG, HSIN-CHIH; SHEN, YU-TIEN; CHANG, YU-CHEN
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 063959/0957 →
Continuity (1)
Related Publication 20240387651A1 · Nov 21, 2024
References Cited (11)
US 11342227B2 · Lilak · 2022 [cited by examiner]
US 20120286829A1 · Yamji · 2012 [cited by applicant]
US 20130146891A1 · Xin et al. · 2013 [cited by applicant]
US 20170125574A1 · Chowdhury et al. · 2017 [cited by applicant]
US 20210050444A1 · Matsushima et al. · 2021 [cited by applicant]
US 20240072136A1 · Lin · 2024 [cited by examiner]
US 20250006741A1 · Wang · 2025 [cited by examiner]
TW 201428931A · 2014 [cited by applicant]
TW 202119627A · 2021 [cited by applicant]
TW 202243159A · 2022 [cited by applicant]
TW 202314866A · 2023 [cited by applicant]