Cooling method and apparatus using internal circulation air flow
An apparatus is provided. The apparatus includes: a first substrate including first cooling means using a refrigerant that is circulated with the outside; a second substrate disposed to be in parallel with, and apart from, the first substrate and thus to form first heat accumulation space between the first and second substrates, the second substrate including second cooling means using a refrigerant that is circulated with the outside; a first fan generating a first air flow in the first heat accumulation space in a direction parallel to the first and second substrates; and a housing of a closed structure.
1. An apparatus comprising:
a first substrate including first cooling means using a refrigerant that is circulated with an outside;
a second substrate disposed to be in parallel with, and apart from, the first substrate and thus to form first heat accumulation space between the first and second substrates, the second substrate including second cooling means using a refrigerant that is circulated with the outside;
a first fan generating a first air flow in the first heat accumulation space in a direction parallel to the first and second substrates;
a housing of a closed structure;
a temperature sensor measuring the temperature in the apparatus at intervals of a predetermined amount of time; and
a first air flow controller automatically controlling an angle of the first fan in response to the temperature measured by the temperature sensor being outside of a predefined valid temperature range,
wherein the first air flow controller includes
a first fan tilt control motor configured to provide power for primarily controlling the angle of the first fan, and
a first air flap disposed between the first fan and the first heat accumulation space, the first air flap configured to secondarily control the first air flow generated by the first fan.
2. The apparatus of claim 1 , further comprising:
a third substrate arranged to be in parallel with, and apart from, the second substrate and thus to form second heat accumulation space between the second and third substrates, the third substrate including third cooling means using the refrigerant that is circulated with the outside,
wherein a number of devices positioned in the first heat accumulation space is greater than a number of devices positioned in the second heat accumulation space.
3. The apparatus of claim 1 , further comprising:
a third substrate arranged to be in parallel with, and apart from, the second substrate and thus to form second heat accumulation space between the second and third substrates, the third substrate including third cooling means using the refrigerant that is circulated with the outside;
a first temperature sensor measuring the temperature of the first heat accumulation space; and
a second temperature sensor measuring the temperature of the second heat accumulation space,
wherein the temperature measured by the first temperature is higher than the temperature measured by the second temperature sensor.
4. The apparatus of claim 1 , further comprising:
a third substrate arranged to be in parallel with, and apart from, the second substrate and thus to form second heat accumulation space between the second and third substrates, the third substrate including third cooling means using the refrigerant that is circulated with the outside; and
a second fan generating a second air flow in the second heat accumulation space in a direction parallel to the second and third substrates and in an opposite direction to that of the first air flow.
5. The apparatus of claim 4 , further comprising:
a second air flow controller automatically controlling an angle of the second fan.
6. The apparatus of claim 5 , wherein
the second air flow controller includes a second fan tilt control motor configured to provide power for primarily controlling the angle of the second fan, and
a second air flap disposed between the second fan and the second heat accumulation space, the second air flap configured to secondarily control the second air flow generated by the second fan.
7. The apparatus of claim 1 , wherein the apparatus is a test head of a wafer test apparatus.
8. A cooling method using an internal circulation air flow, the cooling method performed by an apparatus including substrates, fans, and a housing of a closed structure, the cooling method comprising:
providing, by a first substrate, first cooling means using a refrigerant that is circulated with an outside;
forming first heat accumulation space between the first substrate and a second substrate, which is disposed to be in parallel with, and apart from, the first substrate, and providing, by the second substrate, second cooling means using the refrigerant that is circulated with the outside;
generating, by a first fan, a first air flow in the first heat accumulation space in a direction parallel to the first and second substrates;
measuring, by a temperature sensor, the temperature in the apparatus at intervals of a predetermined amount of time, and
automatically controlling, by a first air flow controller, an angle of the first fan if the temperature measured by the temperature sensor is not within a predefined valid temperature range,
wherein the first air flow controller includes
a first fan tilt control motor configured to provide power for primarily controlling the angle of the first fan, and
a first air flap disposed between the first fan and the first heat accumulation space, the first air flap configured to secondarily control the first air flow generated by the first fan.
9. The cooling method of claim 8 , further comprising:
forming second heat accumulation space between the second substrate and a third substrate, which is disposed to be in parallel with, and apart from, the second substrate, and providing, by the third substrate, third cooling means using the refrigerant that is circulated with the outside,
wherein a number of devices positioned in the first heat accumulation space is greater than a number of devices positioned in the second heat accumulation space.
10. The cooling method of claim 9 , wherein
the forming the second heat accumulation space and the providing the third cooling means, comprises measuring, by a first temperature sensor, the temperature of the first heat accumulation space and measuring, by a second temperature sensor, the temperature of the second heat accumulation space, and
the temperature measured by the first temperature sensor is higher than the temperature measured by the second temperature sensor.
11. The cooling method of claim 9 , wherein the forming the second heat accumulation space and the providing the third cooling means, comprises generating, by a second fan, a second air flow in a direction parallel to the second and third substrates and in an opposite direction to that of the first air flow.
12. The cooling method of claim 11 , further comprising:
automatically controlling, by a second air flow controller, an angle of the second fan.
13. The cooling method of claim 12 ,
the second air flow controller includes a second fan tilt control motor, configured to provide power for primarily controlling the angle of the second fan, and
a second air flap disposed between the second fan and the second heat accumulation space, the second air flap configured to secondarily control the second air flow generated by the second fan.
14. The cooling method of claim 8 , wherein the apparatus is a test head of a wafer test apparatus.