Patent Assignment
Reel/Frame 067526/0406
Change of Name
Recorded: 2024-05-23
Pages: 15
Assignor
YIK CORPORATION
Executed: 2024-04-01
Assignee
YC CORPORATION
28, PANGYO-RO 255BEON-GIL, BUNDANG-GU, SEONGNAM-SI,, (SAMPYEONG-DONG, DHK SOLUTION BUILDING), GYEONGGI-DO,, KOREA, REPUBLIC OF
Covered Properties
(4)
Cooling Method and Apparatus Using Internal Circulation Air Flow
Semiconductor Wafer Test System for Controlling Supply of Power to Semiconductor Wafer Test Apparatus and Method of Controlling Supply of Power to Semiconductor Wafer Test Apparatus
Semiconductor Test Apparatus Using Fpga and Memory Control Method for Semiconductor Test
Semiconductor Test Apparatus Capable of Inducing Reduction of Power Consumption
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 12, 2023
From: JEON, DONG JE; LEE, KWANG HWA
To: YIK CORPORATION
Reel/Frame 063925/0876 →
Assignment of Assignor's Interest
Jun 28, 2023
From: KIM, YONG HYUN; JOO, JAE HOON; JO, HYO SANG; JEON, KI YOUNG
To: YIK CORPORATION
Reel/Frame 064092/0914 →
Assignment of Assignor's Interest
Jul 6, 2023
From: JO, HYO SANG; PARK, WAN SOON; KIM, YONG HYUN; JOO, JAE HOON
To: YIK CORPORATION
Reel/Frame 064164/0548 →
Assignment of Assignor's Interest
Jul 11, 2023
From: PARK, WAN SOON
To: YIK CORPORATION
Reel/Frame 064215/0723 →