Semiconductor test apparatus capable of inducing reduction of power consumption
A semiconductor test apparatus is provided. The semiconductor test apparatus includes: a test management unit determining a test mode, generating a test signal in accordance with the determined test mode, and transmitting the test signal to fail memories; and one or more fail memory boards including the fail memory, which store fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals, wherein if the determined test mode is a first test mode, at least some of the failure memory boards are powered off.
1 . A semiconductor test apparatus comprising:
a test management unit configured to determine a test mode, generate a test signal in accordance with the determined test mode, and transmit the test signal to fail memories, the fail memories configured to store fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals; and
one or more fail memory boards including the fail memories,
wherein the test management unit is further configured to cause at least some of the fail memory boards to be powered off if the determined test mode is a first test mode.
2 . The semiconductor test apparatus of claim 1 , wherein the test management unit is configured to automatically determine the test mode by analyzing a loaded test program.
3 . The semiconductor test apparatus of claim 2 , wherein the test management unit is configured to automatically determine the test mode by interpreting a user-written program.
4 . The semiconductor test apparatus of claim 1 , wherein the test management unit is configured to automatically determine the test mode by analyzing a number of instructions involving an access of the fail memory boards by a loaded test program.
5 . The semiconductor test apparatus of claim 1 , wherein the first test mode is a post-repair mode.
6 . The semiconductor test apparatus of claim 1 , further comprising:
one or more alternating current (AC)-to-direct current (DC) converters (ADCs) connected to the fail memory boards; and
an interface board is configured to provide a second control signal to the ADCs,
wherein the ADCs is configured to power off the fail memory boards in response to the second control signal.
7 . The semiconductor test apparatus of claim 6 , wherein if the determined test mode is the first test mode,
the test management unit is configured to provide a first control signal, which is associated with power for the fail memory boards, to the interface board, and
the interface board is configured to provide the second control signal to the ADCs in response to the first control signal.
8 . The semiconductor test apparatus of claim 7 , wherein
each of the ADCs is connected to some of the fail memory boards,
the interface board is configured to receive the first control signal from the test management unit and provide the second control signal to all the ADCs, and
each of the ADCs is configured to power off all the fail memory boards connected thereto in response to the second control signal.
9 . The semiconductor test apparatus of claim 1 , further comprising:
an interface board configured to provide a third control signal to the fail memory boards,
wherein
the test management unit is configured to provide a first control signal, which is for powering off the fail memory boards, to the interface board,
the interface board is configured to provide the third control signal to the fail memory boards in response to the first control signal, and
power for the fail memories mounted on each of the fail memory boards is configured to be cut off in response to the third control signal.
10 . The semiconductor test apparatus of claim 9 , wherein
the interface board is configured to provide the third control signal to all the fail memory boards in response to the first control signal, and
power for all the fail memory boards that have received the third control signal is configured to be cut off.
11 . A semiconductor test apparatus comprising:
a test management unit is configured to generate a test signal in accordance with a test program, transmit the test signal to fail memories, calculate an amount of input/output (I/O) usage in connection with the an execution of the test program, and determine whether to generate a first control signal based on the calculated amount of I/O usage; and
a plurality of fail memory boards including fail memory, which include fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals,
wherein the test management unit is further configured to cause some of the fail memory boards to be powered off when the first control signal is generated.
12 . The semiconductor test apparatus of claim 11 , wherein the test management unit is configured to automatically determine a number of fail memories for the test that is proportional to the amount of I/O usage, by calculating the amount of I/O usage.
13 . The semiconductor test apparatus of claim 11 , wherein the first control signal is associated with a number of fail memories for the test.
14 . The semiconductor test apparatus of claim 11 , further comprising:
one or more alternating current (AC)-to-direct current (DC) converters (ADCs) connected to the fail memory boards; and
an interface board is configured to provide a second control signal to the ADCs,
wherein the ADCs is configured to power off the fail memory boards in response to the second control signal.
15 . The semiconductor test apparatus of claim 14 , wherein
the test management unit is configured to provide the first control signal, which is associated with power for the fail memory boards, to the interface board, and
the interface board is configured to provide the second control signal to the ADCs in response to the first control signal.
16 . The semiconductor test apparatus of claim 14 , wherein
each of the ADCs is connected to some of the fail memory boards,
the interface board is configured receive the first control signal from the test management unit and provide the second control signal to some of the ADCs, and
each of the ADCs that have received the second control signal is configured to powers off all the fail memory boards connected thereto in response to the second control signal.
17 . The semiconductor test apparatus of claim 14 , wherein
the ADCs include first and second ADCs,
the first ADC is connected to one or more of the fail memory boards, and
the second ADC is connected to a number of fail memory boards that is same as, or different from, a number of fail memory boards connected to the first ADC.
18 . The semiconductor test apparatus of claim 11 , further comprising:
an interface board configured to provide a third control signal to the fail memory boards,
wherein
each of the fail memory boards is configured to receive a third control signal and cut off power for fail memory mounted thereon in response to the third control signal.
19 . The semiconductor test apparatus of claim 18 , wherein
the test management unit is configured to provides provide the first control signal, which is associated with power for the fail memory boards, to the interface board, and
the interface board is configured to receive the first control signal from the test management unit and provide the third control signal to the fail memory boards.
20 . The semiconductor test apparatus of claim 18 , wherein
the interface board is configured to receive the first control signal from the test management unit and provide the third control signal to some of the fail memory boards, and
power for the fail memory boards that have received the third control signal is configured to be cut off.