Patent Assignment
Reel/Frame 064092/0914
Assignment of Assignor's Interest
Recorded: 2023-06-28
Pages: 4
Assignors
KIM, YONG HYUN
Executed: 2023-06-01
JOO, JAE HOON
Executed: 2023-06-01
JO, HYO SANG
Executed: 2023-06-01
JEON, KI YOUNG
Executed: 2023-06-01
Assignee
YIK CORPORATION
29 PANGYO-RO 255BEON-GIL, BUNDANG-GU, SEONGNAM-SI, GYEONGGI-DO, 13486, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Wafer Test System for Controlling Supply of Power to Semiconductor Wafer Test Apparatus and Method of Controlling Supply of Power to Semiconductor Wafer Test Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.