Adaptive erase pulse to improve memory cell endurance and erase time in non-volatile memory
To improve memory cell endurance and erase times for non-volatile memories, such as NAND memory, a sub-block based adaptive erase pulse is used. In a memory structure where the array is composed of blocks that have multiple sub-blocks, after applying an erase pulse to an erase selected block, one of the sub-blocks is erased verified and, if it fails to verify, the next erase pulse's duration is tuned based on the number of memory cells of that sub-block that fail to verify. If the first verified one of the sub-blocks verifies, the other sub-blocks of the erase selected block are erased verified, with the next erase pulse's duration tuned based on the number of the other sub-blocks that fail to verify.
1 . A non-volatile memory system, comprising:
a control circuit configured to connect to an array of non-volatile memory cells comprising a plurality of blocks, each of the blocks comprising a plurality of sub-blocks, the control circuit configured to:
apply a first erase pulse of a first duration to a selected one of the blocks;
subsequent to applying the first erase pulse to the selected block, individually erase verify one or more of the sub-blocks of the selected block, including:
erase verifying a first sub-block of the selected block, including determining a number of memory cells of the first sub-block having a voltage threshold above an erase verify level;
in response to less than all of the sub-blocks verifying as erased, apply a second erase pulse of a second duration to the selected block; and
prior to applying the second erase pulse to the selected block, determine the second duration based on a number of the sub-blocks of the selected block that do not verify as erased and on the number of the memory cells of the first sub-block having the voltage threshold above the erase verify level.
2 . The non-volatile memory system of claim 1 , wherein the array is on a first die and the control circuit is on a second die, separate from and bonded to the first die.
3 . The non-volatile memory system of claim 1 , wherein the second duration is greater than the first duration.
4 . The non-volatile memory system of claim 1 , wherein the second duration is less than the first duration.
5 . The non-volatile memory system of claim 1 , wherein to individually erase verify one or more of the sub-blocks of the selected block the control circuit is further configured to:
in response to the first sub-block not verifying as erased, individually erase verify one or more additional sub-blocks of the selected block; and
further determine the second duration based on a number of the one or more additional sub-blocks of the selected block that do not verify as erased.
6 . The non-volatile memory system of claim 1 , wherein the control circuit is further configured to:
in response to less than all of the sub-blocks verifying as erased and prior to applying the second erase pulse, determine whether the second erase pulse would exceed a maximum number of erase pulses; and
in response to determining that the second erase pulse would exceed the maximum number of erase pulses, not apply the second erase pulse and return an erase fail status.
7 . The non-volatile memory system of claim 1 , wherein the control circuit is further configured to:
in response to all of the sub-blocks verifying as erased, not apply the second erase pulse and return an erase pass status.
8 . The non-volatile memory system of claim 1 , further comprising:
the array of non-volatile memory cells, the array having a three dimensional NAND architecture in which a plurality of NAND run vertically relative to a horizontal substrate.
9 . A method, comprising:
applying a first erase pulse of a first duration to a block of an array of non-volatile memory cells, the array having a NAND architecture in which the block includes a plurality of distinct subsets of NAND strings;
subsequent to applying the first erase pulse to the block, erase verifying a first of the distinct subsets, but not others of the distinct subsets, of the block;
in response to the first subset not passing the erase verify, determining a number of memory cells of the first subset that do have a threshold voltage above an erase verify level;
based on the number of memory cells of the first subset that have the threshold voltage above the erase verify level, determining a second duration for a second erase pulse; and
applying the second erase pulse of the second duration to the block.
10 . The method of claim 9 , wherein the distinct subsets of the block are sub-blocks.
11 . The method of claim 9 , further comprising:
in response to the first subset passing the erase verify, individually erase verifying one or more additional subsets of the block; and
in response to less than all of the additional subsets verifying as erased, determining the second duration based on a number of subsets that do not verify as erased.
12 . The method of claim 11 , wherein individually erase verifying one or more additional subsets of the block comprises:
erase verifying a first of the additional subsets; and
in response to the first of the additional subsets not verifying, erase verifying a second of the additional subsets.
13 . The method of claim 11 , wherein individually erase verifying one or more additional subsets of the block comprises erase verifying all of the additional subsets and determining the number of all of the additional subsets that do not erase verify.
14 . The method of claim 11 , further comprising:
in response to less than all of the subsets verifying as erased and prior to applying the second erase pulse, determining whether the second erase pulse would exceed a maximum number of erase pulses; and
in response to determining that the second erase pulse would exceed the maximum number of erase pulses, not applying the second erase pulse and returning an erase fail status.
15 . A non-volatile memory system, comprising:
an array of non-volatile memory cells having a NAND architecture and comprising a plurality of blocks, each of the blocks comprising a plurality of sub-blocks;
means for applying a plurality of erase pulses to a selected block of the array;
means for sequentially erase verifying the sub-blocks, beginning with a first of the sub-blocks, of the selected block subsequent to applying each of the erase pulses thereto; and
means for determining a duration for the erase pulses by:
subsequent to applying a first erase pulse, erase verifying the first sub-block of the selected block and, in response to the first sub-block not passing the erase verifying, determining a number of memory cells of the first sub-block that have a threshold voltage above an erase verify level; and
based on the number of memory cells of the first sub-block that have the threshold voltage above the erase verify level, determining a duration for a subsequent, second erase pulse.
16 . The non-volatile memory system of claim 15 , wherein the means for determining the duration of the erase pulses further determines the duration of the erase pulses by:
in response to the first sub-block of the selected block passing the erase verify, erase verifying one or more additional sub-blocks of the selected block; and
in response to less than all of the additional sub-blocks of the selected block verifying as erased, determine a second duration based on a number of sub-blocks of the selected block that do not verify as erased.
17 . The non-volatile memory system of claim 16 , wherein the means for determining the duration of the erase pulses further determines the duration of the erase pulses by:
erase verifying a first of the additional sub-block of the selected block; and
in response to the first of the additional sub-block of the selected block, erase verifying a second sub-block of the selected block.
18 . The non-volatile memory system of claim 16 , wherein the means for determining the duration of the erase pulses further determines the duration of the erase pulses by erase verifying all of the additional sub-blocks of the selected block and determining the number of all of the additional sub-blocks of the selected block that do not erase verify.
19 . The non-volatile memory system of claim 16 , wherein the means for determining the duration of the erase pulses further determines the duration of the erase pulses by:
in response to less than all of the sub-blocks of the selected block verifying as erased and prior to applying the second erase pulse, determining whether the second erase pulse would exceed a maximum number of erase pulses; and
in response to determining that the second erase pulse would exceed the maximum number of erase pulses, not applying the second erase pulse and returning an erase fail status.
20 . The non-volatile memory system of claim 15 , wherein the array is on a first die and the means for applying a plurality of erase pulses to a selected block of the array, the means for sequentially erase verifying the sub-blocks of the selected block, and the means for determining a duration for the erase pulses are part of a control circuit formed on a second die, separate from and bonded to the first die.