IP Library Patent Application 18409615
Patent Application
App. No. 18/409,615

Functionalized Metal and Nitride CMP Slurry

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Quick Facts
Patent No.
US None
App. No.
18/409,615
Abstract

The invention provides a chemical mechanical polishing solution for metal and metal nitride substrates. The polishing solution includes a solvent; functionalized carbon-based particles having oxygen-containing functional groups a silica abrasive; a Fenton's catalyst or reagent and a corrosion inhibitor. The functionalized carbon-based particles have oxygen-containing functional groups that react with a peroxy moiety to increase oxygen to carbon atomic ratio on the functionalized carbon-based particles. The functionalized carbon-based particles contain at least 10 weight percent of an sp3-containing structure, the functionalized carbon-based particles include at least 0.01 atomic percent oxygen and a surface of the functionalized carbon-based particles has an atomic oxygen to carbon ratio of at least 0.01.

Claims (15)

1 . A chemical mechanical polishing solution for metal and metal nitride substrates comprising:

a solvent;

functionalized carbon-based particles having oxygen-containing functional groups, the functionalized carbon-based particles having oxygen-containing functional groups react with a peroxy moiety to increase oxygen to carbon atomic ratio on the functionalized carbon-based particles, the functionalized carbon-based particles containing at least 10 weight percent of an sp3-containing structure, wherein the functionalized carbon-based particles include at least 0.01 atomic percent oxygen and wherein a surface of the functionalized carbon-based particles has an atomic oxygen to carbon ratio of at least 0.01;

a silica abrasive;

a Fenton's catalyst or reagent; and

a corrosion inhibitor.

2 . The polishing solution of claim 1 wherein the polishing solution includes a nitrogen-containing inhibitor for the metal or the metal nitride.

3 . The polishing solution of claim 1 wherein the surface of the functionalized carbon-based particles includes a graphene, graphite, amorphous carbon or a mixture thereof.

4 . The polishing solution of claim 1 wherein the oxygen-containing functional group is a COOH and its salts, COOOH and its salts, OH—, ketone, oxirane or a combination thereof.

5 . The polishing solution of claim 4 wherein the functionalized carbon-based particles also include an amine (NH 2 ) group, sulfonate (SO 3 ) group or hydrocarbon (C—H) groups.

6 . The polishing solution of claim 1 wherein the metal and metal nitride is selected from the group consisting of cobalt, copper, molybdenum, tungsten, titanium nitride and tantalum nitride.

7 . The polishing solution of claim 1 wherein the polishing solution includes hydrogen peroxide as the peroxy moiety and wherein the solution contains at least 0.5 μM hydroxyl radical.

8 . The polishing solution of claim 1 wherein the Fenton's catalyst or reagent is iron.

9 . The polishing solution of claim 1 wherein the functionalized carbon-based particles contain at least 30 weight percent sp3-containing structure.

10 . The polishing solution of claim 1 wherein the functionalized carbon-based particles contain at least 50 weight percent sp3-containing structure.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2024
From: GUO, YI; ARTHUR, MARTIN W
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.
Reel/Frame 066497/0558 →