IP Library › Granted Patent US 12,506,020
Granted Patent B2
US 12,506,020 · App. 18/430,398 · Granted Dec 23, 2025

Substrate processing module and method of moving a workpiece

Inventors: Kirankumar Neelasandra Savandaiah (Bangalore, IN); Srinivasa Rao Yedla (Bangalore, IN); Thomas Brezoczky (Los Gatos, CA)
Assignee: Applied Materials, Inc.
H01L21/67184C23C14/35H01L21/67167H01L21/67196H01L21/67742H01L21/67766H01L21/68707
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Quick Facts
Patent No.
US 12,506,020
App. No.
18/430,398
Granted
Dec 23, 2025
Kind
B2
Abstract

Embodiments disclosed herein include a substrate processing module and a method of moving a workpiece. The substrate processing module includes a shutter stack and two process stations. The shutter stack is disposed between the process stations. The method of moving a workpiece includes moving a supporting portion from a first location to a shutter stack in a first direction, retrieving the workpiece from the shutter stack, and moving the supporting portion to a second location. The transfer chamber assembly and method allows for moving workpieces to and from the shutter stack to the two process stations. A central transfer robot of the substrate processing module is configured to grip both substrates and shutter discs, allowing for one robot when typically two robots would be required.

Claims (55)

1 . A substrate processing module, comprising:

a plurality of walls that partially define a transfer region, the plurality of walls comprising:

a first wall; and

a second wall disposed opposite the first wall;

a process station coupled to the first wall and connected to the transfer region, the process station comprising:

a processing region; and

a process station opening disposed in the first wall and between the processing region and a pedestal assembly having a lift assembly configured to translate a substrate supporting element of the pedestal assembly between the process station opening and the second wall;

a robot disposed in the transfer region, the robot comprising:

a supporting portion comprising a surface configured to secure a workpiece thereon;

a shutter stack disposed in the transfer region, the shutter stack configured to support one or more of a shutter disc and a substrate, the shutter stack comprising:

a stack base comprising a shutter disc support;

a substrate support coupled to the stack base, the substrate support comprising a top portion; and

a stack actuator coupled to the stack base, the stack actuator configured to move the stack base between the first wall and the second wall.

2 . The substrate processing module of claim 1 , wherein the shutter stack is disposed adjacent the process station.

3 . The substrate processing module of claim 1 , wherein a Z direction is defined as an axis between the first wall and the second wall and the stack actuator moves the stack base in the Z direction.

4 . The substrate processing module of claim 1 , wherein the substrate support is disposed between the stack base and the first wall.

5 . The substrate processing module of claim 1 , wherein stack base is disposed on the second wall.

6 . The substrate processing module of claim 1 , wherein the shutter stack is configured to simultaneously support the shutter disc on the shutter disc support and the substrate on the top portion.

7 . The substrate processing module of claim 1 , wherein the supporting portion is configured to grasp a workpiece.

8 . The substrate processing module of claim 1 , wherein the supporting portion is configured to maintain an orientation of a workpiece.

9 . The substrate processing module of claim 1 , wherein the supporting portion extends from the robot and comprises a first grasper and a second grasper, the second grasper disposed further from the robot than the first grasper.

10 . The substrate processing module of claim 1 , wherein the shutter disc support is disposed between the stack base and the top portion.

11 . A substrate processing module, comprising:

a plurality of walls that partially define a transfer region, the plurality of walls comprising:

a first wall; and

a second wall disposed opposite the first wall;

a process station coupled to the first wall and connected to the transfer region, the process station comprising:

a processing region; and

a process station opening disposed in the first wall and between the processing region and a pedestal assembly having a lift assembly configured to translate a substrate supporting element of the pedestal assembly between the process station opening and the second wall;

a supporting portion comprising a surface configured to secure a workpiece thereon;

a shutter stack disposed in the transfer region, the shutter stack configured to support one or more of a shutter disc and a substrate, the shutter stack comprising:

a stack base comprising a shutter disc support; and

a substrate support coupled to the stack base, the substrate support comprising a top portion; and

an actuator configured to move one of the supporting portion or the stack base in relation to the other.

12 . The substrate processing module of claim 11 , wherein the supporting portion comprises a first grasper and a second grasper, the second grasper disposed opposite the first grasper.

13 . The substrate processing module of claim 11 , wherein the supporting portion is configured to translate between the top portion and the stack base.

14 . The substrate processing module of claim 11 , wherein the top portion is configured to secure the substrate.

15 . A substrate processing module, comprising:

a plurality of walls that partially define a transfer region, the plurality of walls comprising:

a first wall; and

a second wall disposed opposite the first wall;

a process station coupled to the first wall and connected to the transfer region, the process station comprising:

a processing region; and

a process station opening disposed in the first wall and between the processing region and a pedestal assembly having a lift assembly configured to translate a substrate supporting element of the pedestal assembly between the process station opening and the second wall;

a robot disposed in the transfer region, the robot comprising:

a supporting portion comprising a surface configured to secure a workpiece thereon;

a shutter stack disposed in the transfer region, the shutter stack configured to support one or more of a shutter disc and a substrate, the shutter stack comprising:

a stack base comprising a shutter disc support; and

a substrate support coupled to the stack base, the substrate support comprising a top portion; and

an actuator configured to move the robot or the stack base in relation to the other.

16 . The substrate processing module of claim 15 , wherein a Z direction is defined as an axis between the first wall and the second wall and the actuator moves the robot or the stack base in the Z direction.

17 . The substrate processing module of claim 15 , wherein the shutter disc support is disposed between the stack base and the top portion.

18 . The substrate processing module of claim 15 , wherein the stack base is coupled to the second wall.

19 . The substrate processing module of claim 15 , wherein the process station is adjacent the shutter stack.

20 . The substrate processing module of claim 15 , wherein the first wall is disposed between the process station and the shutter stack.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2024
From: SAVANDAIAH, KIRANKUMAR NEELASANDRA; YEDLA, SRINIVASA RAO; BREZOCZKY, THOMAS
To: APPLIED MATERIALS, INC.
Reel/Frame 067325/0225 →
Continuity (2)
Continuation 16923792 · Jul 8, 2020
Related Publication 20240258136A1 · Aug 1, 2024
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