IP Library Granted Patent US 12,428,744
Granted Patent B2
US 12,428,744 · App. 18/466,391 · Granted Sep 30, 2025

Nickel electroplating compositions for rough nickel

Inventors: Weigang Wu (Hung Hom, HK); Fai Lung Ting (Solaris Kallang, SG)
Assignee: Rohm and Haas Electronic Materials LLC
C25D3/18C25D3/12C25D5/605
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Quick Facts
Patent No.
US 12,428,744
App. No.
18/466,391
Granted
Sep 30, 2025
Kind
B2
Abstract

Nickel electroplating compositions containing thiourethanes deposit rough nickel on substrates. The rough nickel can be electroplated over wide current density ranges. The rough nickel deposits enable improved adhesion to other metal layers in contrast to many conventional nickel deposits.

Claims (19)

1. A method of electroplating nickel metal on a substrate:

a) providing the substrate;

b) contacting the substrate with a nickel electroplating composition, wherein the nickel electroplating composition comprises nickel ions and a thiourethane having a formula:

wherein R 1 and R 2 are independently chosen from hydrogen, linear or branched hydroxy (C 1 -C 6 )alkyl, linear or branched carboxy (C 1 -C 6 )alkyl, linear or branched amino (C 1 -C 6 )alkyl, (C 5 -C 6 )cycloalkyl ring, or R 2 can be sulfur, and G is carbon or nitrogen, and salts of the thiourethanes, the nickel electroplating composition is free of alloying metals; and

c) depositing a nickel layer on the substrate, wherein the nickel layer comprises a Sa ≥70 nm and a Sdr≥4%.

2. The method of claim 1 , wherein the thiourethane has a formula:

wherein R 1 and R 2 are independently chosen from hydrogen, linear or branched (C 1 -C 6 )alkyl, linear or branched hydroxy (C 1 -C 6 )alkyl, linear or branched carboxy (C 1 -C 6 )alkyl, linear or branched amino (C 1 -C 6 )alkyl, and salts of the thiourethanes.

3. The method of claim 1 , wherein the thiourethane has the following formula:

4. The method of claim 1 , wherein the thiourethane is in amounts of 5 ppm or greater.

5. The method of claim 4 , wherein the thiourethane is in amounts of 10 ppm to 100 ppm.

6. The method of claim 1 , wherein a source of nickel ions is selected from the group consisting of nickel sulfate, nickel sulfate hexahydrate, nickel sulfate heptahydrate, nickel sulfamate, nickel sulfamate tetrahydrate, nickel chloride, nickel chloride hexahydrate, nickel carbonate, nickel methane sulfonate, nickel bromide, nickel fluoride, nickel iodide, nickel oxalate, nickel citrate, nickel tetrafluoroborate, nickel hypophosphite, nickel acetate and mixtures thereof.

7. The method of claim 1 , further comprising a source of chloride ions.

8. The method of claim 7 , wherein the source of chloride ions is selected from the group consisting of nickel chloride, nickel chloride hexahydrate, hydrogen chloride, sodium chloride, potassium chloride, magnesium chloride, calcium chloride, ammonium chloride, guanidine hydrochloride, ethylenediamine dihydrochloride, trimethylammonium chloride, pyridine hydrochloride, phenylammonium chloride, hydrazine dihydrochloride and mixtures thereof.

9. The method of claim 1 , wherein a pH of the nickel electroplating composition is from 2 to 6.

10. The method of claim 1 , further comprising a pH adjusting agent.

11. The method of claim 10 , wherein the pH adjusting agent is selected from the group consisting sulfuric acid, hydrochloric acid, sulfamic acid, boric acid, acetic acid, amino acetic acid, ascorbic acid, lactic acid, 5-sulfosalicylic acid and salts thereof.

12. The method of claim 1 , further comprising a surfactant.

13. The method of claim 12 , wherein the surfactant is selected from the group consisting of sodium di(1,3-dimethylbutyl) sulfosuccinate, sodium-2-ethylhexylsulfate, sodium diamyl sulfosuccinate, sodium lauryl sulfate, sodium lauryl ether-sulfate, sodium di-alkylsulfosuccinates and sodium dodecylbenzene sulfonate, perfluorinated quaternary amines and mixtures thereof.

14. The method of claim 1 , wherein the nickel electroplating composition is free of cyanide compounds.

Assignments (5)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS LLC
To: DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC
Reel/Frame 069272/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2023
From: WU, WEIGANG
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 065195/0642 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2023
From: TING, FAI LUNG
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 065195/0702 →
Continuity (2)
Provisional Application 63409947 · Sep 26, 2022
Related Publication 20240124999A1 · Apr 18, 2024
References Cited (22)
US 4384929A · Tremmel et al. · 1983 [cited by applicant]
US 4549942A · Tremmel · 1985 [cited by examiner]
US 7190057B2 · Seki et al. · 2007 [cited by applicant]
US 7285845B2 · Kang et al. · 2007 [cited by applicant]
US 8937378B2 · Paek et al. · 2015 [cited by applicant]
US 9171789B2 · Shin et al. · 2015 [cited by applicant]
US 20200141009A1 · Nanbu · 2020 [cited by examiner]
US 20200347503A1 · Engelhardt et al. · 2020 [cited by applicant]
US 20230203693A1 · Chun · 2023 [cited by examiner]
US 20240117516A1 · Wu et al. · 2024 [cited by applicant]
CA 1255620A · 1989 [cited by applicant]
CN 100475685 · 2009 [cited by applicant]
JP 1171257A · 1989 [cited by applicant]
JP 01222064A · 1989 [cited by examiner]
JP 2001192848A · 2001 [cited by examiner]
JP 2016094659A · 2016 [cited by applicant]
WO 2022085464A1 · 2022 [cited by applicant]
Iwamatsu et al. (JP2001192848A, machine translation). (Year: 2001). [cited by examiner]
JP-01222064-A, machine translation). (Year: 1989). [cited by examiner]
Search report for corresponding EP Application No. 23199597.8 dated Feb. 27, 2024. [cited by applicant]
Hang, Study on the Adhesion Between Epoxy Molding Compound and Nanocone-Arrayed Pd Preplated Leadframes; Journal of Electronic Materials, 2007, vol. 36, No. 12. [cited by applicant]
Ni, Adhesion Improvement of Epoxy Molding Compound—Pd Preplated Leadframe Interface Using Shaped Nickel Layers, Microelectronics Reliability, 2012, 52, pp. 206-211. [cited by applicant]