IP Library Granted Patent US 12,622,202
Granted Patent B2
US 12,622,202 · App. 18/537,661 · Granted May 5, 2026

Substrate processing apparatus

Inventor: Euisang Lim (Cheonan-si, KR)
Assignee: Semes Co., Ltd.
H10P72/0408H10P70/80H10P72/0451H10P70/20H10P72/0414H10P72/0462
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Quick Facts
Patent No.
US 12,622,202
App. No.
18/537,661
Granted
May 5, 2026
Kind
B2
Abstract

A substrate processing apparatus includes a first drying unit configured to perform a first drying process using a drying fluid on a substrate having a liquid film formed thereon, a first fluid supply unit configured to supply the drying fluid into the first drying unit, a second drying unit configured to perform a second drying process using the drying fluid on the substrate on which the first drying process is performed, a second fluid supply unit configured to supply the drying fluid into the second drying unit, a first door configured to control opening and closing of the first drying unit, and a second door configured to control opening and closing of the second drying unit, wherein the first door is opened when pressure in the first drying unit reaches a first transfer pressure, and the second door is opened when pressure in the second drying unit reaches a second transfer pressure.

Claims (59)

1 . A substrate processing apparatus comprising:

a first drying unit configured to perform a first drying process using a drying fluid on a substrate having a liquid film formed thereon, the first drying unit including a first door that is configured to open and close the first drying unit;

a first fluid supply unit configured to supply the drying fluid into the first drying unit;

a second drying unit configured to perform a second drying process using the drying fluid on the substrate on which the first drying process is performed, the second drying unit having a second door that is configured to open and close the second drying unit;

a second fluid supply unit configured to supply the drying fluid into the second drying unit; and

a controller configured to control the first door and the second door in order to transfer the substrate from the first drying unit to the second drying unit, wherein the controller is configured to control the first door to open the first door in response to pressure in the first drying unit reaching a first transfer pressure, and the controller is configured to control the second door to open the second door in response to pressure in the second drying unit reaching a second transfer pressure.

2 . The substrate processing apparatus of claim 1 , wherein the substrate on which the first drying process is performed is transferred through the first door and the second door.

3 . The substrate processing apparatus of claim 1 , further comprising a waiting space adjacent to the first drying unit and the second drying unit, wherein the first transfer pressure is lower than or equal to a waiting pressure inside the waiting space.

4 . The substrate processing apparatus of claim 1 , further comprising a waiting space adjacent to the first drying unit and the second drying unit, wherein the second transfer pressure is higher than or equal to a waiting pressure inside the waiting space.

5 . The substrate processing apparatus of claim 1 , further comprising a waiting space between the first drying unit and the second drying unit.

6 . The substrate processing apparatus of claim 1 , wherein the drying fluid is in a supercritical state while the first drying process and the second drying process are performed in the first drying unit and the second drying unit, respectively.

7 . The substrate processing apparatus of claim 1 , wherein the first transfer pressure is lower than or equal to the second transfer pressure.

8 . A substrate processing apparatus comprising:

a first drying unit configured to perform a first drying process using a drying fluid on a substrate having a liquid film formed thereon, the first drying unit including a first door that is configured to open and close the first drying unit;

a second drying unit configured to perform a second drying process using the drying fluid on the substrate on which the first drying process is performed, the second drying unit having a second door that is configured to open and close the second drying unit;

a waiting space adjacent to the first drying unit and the second drying unit;

a transfer apparatus configured to transfer, to the second drying unit, the substrate on which the first drying process is performed in the first drying unit; and

a controller configured to control the first door and the second door in order to transfer the substrate from the first drying unit to the second drying unit, wherein the controller is configured to control the first door to open the first door in response to pressure in the first drying unit reaching a first transfer pressure, the controller is configured to control the second door to open the second door in response to pressure in the second drying unit reaching a second transfer pressure, and the first transfer pressure is lower than or equal to the second transfer pressure.

9 . The substrate processing apparatus of claim 8 , wherein the transfer apparatus is configured to:

in response to the first door being opened, transfer, to the waiting space, the substrate on which the first drying process is performed; and

in response to the second door being opened, transfer, from the waiting space to the second drying unit, the substrate on which the first drying process is performed.

10 . The substrate processing apparatus of claim 8 , further comprising:

a first fluid supply unit configured to supply the drying fluid into the first drying unit while the first drying process is performed on the substrate; and

a second fluid supply unit configured to supply the drying fluid into the second drying unit while the second drying process is performed on the substrate on which the first drying process is performed.

11 . The substrate processing apparatus of claim 8 , wherein pressure of the waiting space is greater than or equal to the first transfer pressure, and is lower than or equal to the second transfer pressure.

12 . The substrate processing apparatus of claim 8 , further comprising:

a first fluid supply unit configured to supply the drying fluid into the first drying unit; and

a first fluid exhaust unit configured to exhaust the drying fluid to an outside of the first drying unit,

wherein the controller is configured to control the first fluid supply unit and the first fluid exhaust unit to

increase the pressure in the first drying unit to a first process pressure at which the first drying process is performed; and

reduce the pressure in the first drying unit to the first transfer pressure.

13 . The substrate processing apparatus of claim 12 , further comprising:

a second fluid supply unit configured to supply the drying fluid into the second drying unit; and

a second fluid exhaust unit configured to exhaust the drying fluid to an outside of the second drying unit,

wherein the controller is configured to control the second fluid supply unit and the second fluid exhaust unit to

increase the pressure in the second drying unit to the second transfer pressure; and

increase the pressure in the second drying unit to a second process pressure at which the second drying process is performed.

14 . A substrate processing method comprising:

cleaning a substrate;

transporting the substrate to a drying processing unit, the drying processing unit including

a first drying unit configured to perform a first drying process using a drying fluid on the substrate having a liquid film formed thereon, the first drying unit including a first door that is configured to open and close the first drying unit;

a first fluid supply unit configured to supply the drying fluid into the first drying unit;

a second drying unit configured to perform a second drying process using the drying fluid on the substrate on which the first drying process is performed, the second drying unit having a second door that is configured to open and close the second drying unit;

a second fluid supply unit configured to supply the drying fluid into the second drying unit; and

a controller configured to control the first door and the second door in order to transfer the substrate from the first drying unit to the second drying unit; and drying the substrate, wherein the drying the substrate includes

boosting pressure in the first drying unit to a first processing pressure;

performing the first drying process on the substrate in the first drying unit at the first processing pressure by using the drying fluid;

reducing pressure in the first drying unit to a first transfer pressure;

controlling, using the controller, the first door of the first drying unit to open the first door in response the pressure in the first drying unit reaching the first transfer pressure;

controlling, using the controller, the second door of the second drying unit to open the second door in response to the pressure in the second drying unit reaching a second transfer pressure;

transferring, from the first drying unit to the second drying unit, the substrate on which the first drying process is performed;

boosting the pressure in the second drying unit to a second processing pressure; and

performing, in the second drying unit at the second processing pressure, the second drying process on the substrate on which the first drying process is performed, by using the drying fluid.

15 . The substrate processing method of claim 14 , further comprising boosting the pressure in the second drying unit to the second transfer pressure in order to perform the transferring.

16 . The substrate processing method of claim 15 , wherein the first transfer pressure in the first drying unit is lower than or equal to the second transfer pressure in the second drying unit.

17 . The substrate processing method of claim 14 , further comprising a waiting space adjacent to the first drying unit and the second drying unit, wherein the transferring includes:

transferring, from the first drying unit to the waiting space, the substrate on which the first drying process is performed; and

transferring, from the waiting space to the second drying unit, the substrate on which the first drying process is performed.

18 . The substrate processing method of claim 14 , wherein the cleaning the substrate includes applying an organic solvent onto the substrate, wherein the organic solvent includes isopropyl alcohol (IPA), the drying fluid includes carbon dioxide (CO2), and the first transfer pressure in the first drying unit and the second transfer pressure in the second drying unit are each about 80 Bar to about 100 Bar.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2024
From: LIM, EUISANG
To: SEMES CO., LTD.
Reel/Frame 066056/0376 →
Priority Claims (1)
KR 10-2022-0185008 · Dec 26, 2022 · national
Continuity (1)
Related Publication 20240213043A1 · Jun 27, 2024
References Cited (24)
US 10504718B2 · Ohno et al. · 2019 [cited by applicant]
US 10576493B2 · Egashira et al. · 2020 [cited by applicant]
US 11482427B2 · Kiyohara et al. · 2022 [cited by applicant]
US 20180138035A1 · Ohno · 2018 [cited by examiner]
US 20180158676A1 · Kiyohara · 2018 [cited by examiner]
US 20180254200A1 · Kawabuchi · 2018 [cited by examiner]
US 20180264504A1 · Egashira · 2018 [cited by examiner]
US 20200047224A1 · Fukui · 2020 [cited by examiner]
US 20200098594A1 · Kiyohara · 2020 [cited by examiner]
US 20220044945A1 · Umezaki · 2022 [cited by examiner]
US 20220090859A1 · Yoon et al. · 2022 [cited by applicant]
US 20220165599A1 · Kawahara · 2022 [cited by examiner]
US 20230290632A1 · Goshi · 2023 [cited by examiner]
KR 1020050087059A · 2005 [cited by applicant]
KR 1020130056758A · 2013 [cited by applicant]
KR 20130053108A · 2013 [cited by examiner]
KR 1020180105089A · 2018 [cited by applicant]
KR 1020220037632A · 2022 [cited by applicant]
KR 1020220093063A · 2022 [cited by applicant]
KR 1020220094144A · 2022 [cited by applicant]
KR 1020220134508A · 2022 [cited by applicant]
WO WO2020195474A1 · 2020 [cited by examiner]
WO WO2024062799A1 · 2024 [cited by examiner]
Korean Office Action dated Jun. 27, 2024 issued in corresponding Korean Appln. No. 10-2022-0185008. [cited by applicant]