Granted Patent B2

US 12,329,551 · App. 18/541,863 · Granted Jun 17, 2025

Inventors: Michael Quinlan (San Francisco, CA); Lucian Mihailescu (Pleasant Hill, CA); Andrei Claudiu Cosma (Emeryville, CA)

Assignee: Ziteo, Inc.

A61B6/037A61B6/4258A61B6/4266A61B6/5235G01T1/295

Abstract

Claims (36)

1. An imaging system comprising:

a gamma-ray photon sensor with energy and position resolution sensing capability, the sensor providing positions of photon interactions;

a coded aperture mask placed in front of the sensor, wherein the mask comprises mask pixel elements shaped as bifrustums, wherein a physical space between bifrustum mask pixel elements that have a common edge is partially or completely occupied by a material, and wherein the mask creates an imaging field of view in front of the sensor;

at least one processor; and

a memory operatively coupled with the sensor and the processor, the memory storing instructions for execution by the at least one processor that cause the processor to:

create a first projected photon interaction point on a plane of reference;

retrieve photon attenuation coefficients stored in the memory for the first projected interaction point for directions towards the imaging field of view;

create a second projected photon interaction point on a plane of reference;

retrieve photon attenuation coefficients stored in the memory for the second projected interaction point for directions towards the imaging field of view; and

reconstruct an image of a gamma-ray source using the retrieved attenuation coefficients for the first and second photon interactions.

2. The imaging system of claim 1 , wherein the sensor provides the position of the photon interaction with resolution better than 4 millimeters (mm) in all three dimensions.

3. The imaging system of claim 1 , wherein the coded aperture mask is made out a material of density higher than 10 grams per cubic centimeter (g/cc).

4. The imaging system of claim 1 , wherein mask pixel elements are shaped as bifrustums that have at least a side face making an angle larger than 3 degrees with respect to the normal on the bifrustum base.

5. The imaging system of claim 1 , wherein creating the first projected photon interaction point on the plane of reference comprises projecting a position of a first photon interaction onto the plane of reference.

6. The imaging system of claim 1 , wherein the mask pixel elements are shaped as bifrustums that have at least a side face making an angle larger than 5 degrees with respect to the normal on the bifrustum base.

7. The imaging system of claim 1 , wherein the bifrustum mask pixel elements have a base selected from a group containing: a rectangular base, a triangular base, a hexagonal base.

8. The imaging system of claim 1 , wherein the shape of bifrustum mask pixel elements is approximated by mask pixel elements with curved side faces.

9. The imaging system of claim 1 , wherein the coded aperture mask expands across multiple planes.

10. The imaging system of claim 1 , further comprising one or more photon attenuating shields at directions around the sensor not covered by the coded aperture mask.

11. The imaging system of claim 1 , wherein the coded aperture mask is built of multiple layers stacked together to approximate the bifrustum shaping of the mask pixels.

12. The imaging system of claim 1 , wherein the coded aperture mask has an opening fraction, defined as fraction of the area of the of mask pixel elements to the total area of the mask, to span from 0.1% to 70%.

13. A method comprising:

based on a first photon interaction detected by a gamma-ray photon sensor, creating a first projected photon interaction point on a first plane of reference, wherein the gamma-ray photon sensor has energy and position resolution sensing capability, the gamma-ray photon sensor providing the position of photon interactions, wherein a coded aperture mask is placed in front of the gamma-ray photon sensor, wherein the mask comprises mask pixel elements shaped as bifrustums, wherein a physical space between bifrustum mask pixel elements that have a common edge is partially or completely occupied by a material, and wherein the mask creates an imaging field of view in front of the sensor;

retrieving photon attenuation coefficients stored in a memory for the first projected interaction photon point for directions towards the imaging field of view;

creating a second projected photon interaction point on a second plane of reference;

retrieving photon attenuation coefficients stored in the memory for the second projected photon interaction point for directions towards the imaging field of view; and

reconstructing an image of a gamma-ray source using the retrieved attenuation coefficients for the first and second photon interactions.

14. The method of claim 13 , wherein the mask has an adjustable geometry.

15. The method of claim 14 , further comprising adjusting the mask from a first configuration to a second configuration to alter one or more of: the imaging field of view, a distance between the mask and the gamma-ray photon sensor, an opening fraction of the mask, a collimation of the mask, or a focusing power of the mask.

16. A coded aperture mask for an imaging system, the mask comprising:

a photon-attenuating material defining a plurality of mask pixel elements configured to permit gamma-ray photons to pass therethrough; and

the plurality of mask pixel elements shaped as bifrustums, wherein a physical space between bifrustum mask pixel elements that have a common edge is partially or completely occupied by the photon-attenuating material.

17. The coded aperture mask of claim 16 , wherein mask pixel elements are shaped as bifrustums that have at least a side face making an angle larger than 3 degrees with respect to the normal on the bifrustum base.

18. The coded aperture mask of claim 16 , wherein the bifrustum mask pixel elements have a base selected from a group containing: a rectangular base, a triangular base, a hexagonal base.

19. The coded aperture mask of claim 16 , wherein the shape of bifrustum mask pixel elements is approximated by mask pixel elements with curved side faces.

20. The coded aperture mask of claim 16 , wherein the coded aperture mask is built of multiple layers stacked together to approximate the bifrustum shaping of the mask pixels.

Assignments (4)

Continuity (5)

References Cited (328)