IP Library Granted Patent US 12,285,767
Granted Patent B2
US 12,285,767 · App. 18/559,618 · Granted Apr 29, 2025

Solder particle classifying method, solder particle, solder particle classifying system, adhesive composition, and adhesive film

Inventors: Shohei Yamazaki (Tokyo, JP); Hiroyuki Izawa (Tokyo, JP); Toshiyuki Sugimoto (Yamagata, JP)
Assignees: Resonac Corporation; Toshiyuki Sugimoto
B03C7/02B07B13/04
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Quick Facts
Patent No.
US 12,285,767
App. No.
18/559,618
Granted
Apr 29, 2025
Kind
B2
Abstract

A method for classifying solder particles includes: a first step of forming an electric field between a first electrode 2 and a second electrode 3 included in an electrostatic attraction device, the first electrode 2 having a disposition part having electrostatic diffusivity or electrical conductivity, the second electrode 3 having an attraction part 4 having electrical insulation properties, which faces the disposition part and is provided with a plurality of opening parts 10 opened to the disposition part side, so as to cause solder particles P disposed on the disposition part to be electrostatically attracted to the attraction part 4 ; a second step of removing solder particles P 2 attracted to areas other than the opening parts 10 of the attraction part 4 ; and a third step of collecting solder particles P 1 accommodated in the opening parts, from the attraction part 4 that has been subjected to the second step.

Claims (15)

1. A method for classifying solder particles, the method comprising:

a first step of forming an electric field between a first electrode and a second electrode included in an electrostatic attraction device, the first electrode having a disposition part having electrostatic diffusivity or electrical conductivity, the second electrode having an attraction part having electrical insulation properties, which faces the disposition part and is provided with a plurality of opening parts opened to the disposition part side, so as to cause solder particles P disposed on the disposition part to be electrostatically attracted to the attraction part;

a second step of removing solder particles P 2 that are attracted to the attraction part and are not accommodated in the opening parts, from the attraction part; and

a third step of collecting solder particles P 1 accommodated in the opening parts, from the attraction part that has been subjected to the second step,

wherein the solder particles P have an average particle size of 10 μm or more.

2. The method for classifying solder particles according to claim 1 , wherein the solder particles P are such that a proportion of particles having a particle size of less than 10 μm is 30% by pieces or less.

3. The method for classifying solder particles according to claim 1 , wherein when an average particle size of the solder particles P is designated as MDp (μm), and an opening diameter of the opening parts is designated as OD (μm), MDp/OD satisfies 0.5 to 1.5.

4. Solder particles having an average particle size of 10 to 100 μm, a CV value of particle size of 3 to 15%, and an average degree of sphericity of 0.90 or more.

5. The solder particles according to claim 4 , wherein the average particle size is 10 to 50 μm.

6. An adhesive composition comprising an adhesive component and the solder particles according to claim 4 .

7. An adhesive film comprising an adhesive component and the solder particles according to claim 4 .

8. A solder particle classification system, comprising:

an electrostatic attraction device including a first electrode having a disposition part having electrostatic diffusivity or electrical conductivity, and a second electrode having an attraction part having electrical insulation properties, which faces the disposition part and is provided with a plurality of opening parts opened to the disposition part side;

a removing means for removing solder particles that are attracted to the attraction part and are not accommodated in the opening parts, from the attraction part; and

a collecting means for collecting solder particles accommodated in the opening parts of the attraction part.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2025
From: YAMAZAKI, SHOHEI; IZAWA, HIROYUKI
To: RESONAC CORPORATION; SUGIMOTO, TOSHIYUKI
Reel/Frame 070527/0819 →
CHANGE OF ADDRESS Recorded Feb 9, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066547/0677 →
Priority Claims (1)
WO PCT/JP2021/017922 · May 11, 2021 · international
Continuity (1)
Related Publication 20240238804A1 · Jul 18, 2024
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