Automated application of drift correction to sample studied under electron microscope
Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
1. A computing system configured for automated drift correction of a sample under observation by an electron microscope, the computing system comprising:
one or more hardware processors
is configured to:
receive input data from the electron microscope, wherein the input data includes images of the sample under observation;
register movement of the sample under observation based on the input data received from the electron microscope,
wherein the movement is registered by comparing the images of the sample under observation against a reference template;
and
send one or more signals to cause the electron microscope to re-center a field of view based on the registered movement of the sample under observation.
2. The computing system of claim 1 , wherein the one or more hardware processors are further configured to calculate an electron dose for the sample under observation based on the input data received from the electron microscope and the registered movement of the sample under observation.
3. The computing system of claim 1 , wherein the one or more signals to cause the electron microscope to re-center the field of view include signals to cause movement to one or more of a mechanical stage of the electron microscope, a goniometer of the electron microscope, a piezo of the electron microscope, or a beam of the electron microscope.
4. The computing system of claim 1 , wherein the one or more hardware processors are further configured to:
display, on a graphical user interface, an image of positions of the sample under observation in a heatmap form; and,
automatically adjust the displayed image to in response to a change in one or more of a sample position and a magnification level, wherein the adjustment is based on the change.
5. The computing system of claim 1 , wherein the one or more hardware processors are further configured to track the movement of the sample under observation over time based on the input data received from the electron microscope.
6. The computing system of claim 1 , wherein the one or more hardware processors are further configured to measure an impact of an electron beam on one or more of: a shape of the sample under observation, a composition of the sample under observation, a density of the sample under observation, an electrical characteristic of the sample under observation, a morphology of the sample under observation, and a microstructure of the sample under observation.
7. The computing system of claim 1 , wherein the one or more hardware processors are further configured to display on a graphical user interface a listing of at least some of the images of the sample under observation, wherein the listing of images includes images that were previously observed by a user.
8. The computing system of claim 2 , one or more hardware processors are further configured to display on a graphical user interface a listing of at least some of the images of the sample under observation, wherein the listing of images includes images that were previously observed by a user along with the electron dose associated with each listed image.
9. The computing system of claim 1 , wherein the input data received from the electron microscope further includes metadata associated with each of the images of the sample under observation.
10. The computing system of claim 1 , wherein the one or more hardware processors are further configured to perform predictive drift correction based on the registered movement of the sample under observation.
11. A computer-implemented method of system configured for automated drift correction of a sample under observation by an electron microscope, the computer-implemented method comprising:
receiving input data from the electron microscope, wherein the input data includes images of the sample under observation;
registering movement of the sample under observation based on the input data received from the electron microscope,
wherein the movement is registered by comparing the images of the sample under observation against a reference template; and
sending one or more signals to cause the electron microscope to re-center a field of view based on the registered movement of the sample under observation.
12. The computer-implemented method of claim 11 , further comprising calculating an electron dose for the sample under observation based on the input data received from the electron microscope and the registered movement of the sample under observation.
13. The computer-implemented method of claim 11 , wherein the one or more signals to cause the electron microscope to re-center the field of view include signals to cause movement to one or more of a mechanical stage of the electron microscope, a goniometer of the electron microscope, a piezo of the electron microscope, or a beam of the electron microscope.
14. The computer-implemented method of claim 11 , further comprising:
displaying, on a graphical user interface, an image of positions of the sample under observation in a heatmap form; and,
automatically adjusting the displayed image to in response to a change in one or more of a sample position and a magnification level, wherein the adjustment is based on the change.
15. The computer-implemented method of claim 11 , further comprising tracking the movement of the sample under observation over time based on the input data received from the electron microscope.
16. The computer-implemented method of claim 11 , further comprising measuring an impact of an electron beam on one or more of: a shape of the sample under observation, a composition of the sample under observation, a density of the sample under observation, an electrical characteristic of the sample under observation, a morphology of the sample under observation, and a microstructure of the sample under observation.
17. The computer-implemented method of claim 11 , further comprising displaying on a graphical user interface a listing of at least some of the images of the sample under observation, wherein the listing of images includes images that were previously observed by a user.
18. The computer-implemented method of claim 12 , further comprising displaying on a graphical user interface a listing of at least some of the images of the sample under observation, wherein the listing of images includes images that were previously observed by a user along with the electron dose associated with each listed image.
19. The computer-implemented method of claim 11 , wherein the input data received from the electron microscope further includes metadata associated with each of the images of the sample under observation.
20. The computer-implemented method of claim 11 , further comprising performing predictive drift correction based on the registered movement of the sample under observation.