IP Library Granted Patent US 12,171,054
Granted Patent B2
US 12,171,054 · App. 18/644,458 · Granted Dec 17, 2024

EUV light source with a beam positioning device

Inventors: Martin Lambert (Korb, DE); Boris Regaard (Stuttgart, DE); Tolga Ergin (Bietigheim-Bissingen, DE); Oliver Schlosser (Filderstadt, DE)
Assignee: TRUMPF Lasersystems for Semiconductor Manufacturing SE
H05G2/008G03F7/70033
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Quick Facts
Patent No.
US 12,171,054
App. No.
18/644,458
Granted
Dec 17, 2024
Kind
B2
Abstract

An extreme ultraviolet (EUV) light source includes a providing device for providing a target material, a pulsed laser source for emitting a pulsed laser beam, and a beam guidance device for supplying the pulsed laser beam from the pulsed laser source into a radiation generation chamber and for focused irradiation of the target material with the pulsed laser beam. The target material is configured to emit EUV radiation on account of the irradiation. The beam guidance device includes a beam positioning device comprising four mirrors as two mirror pairs for positioning the pulsed laser beam. Each of the four mirrors is rotatable about exactly one axis of rotation. The axes of rotation of the two mirrors of a first mirror pair are aligned along a first spatial direction. The axes of rotation of the two mirrors of a second mirror pair are aligned along a second spatial direction.

Claims (23)

1. An extreme ultraviolet (EUV) light source comprising:

a providing device for providing a target material,

at least one pulsed laser source for emitting at least one pulsed laser beam,

a beam guidance device for supplying the at least one pulsed laser beam from the at least one pulsed laser source into a radiation generation chamber and for focused irradiation of the target material with the at least one pulsed laser beam within the radiation generation chamber,

the target material being configured to emit EUV radiation on account of the irradiation,

wherein

the beam guidance device comprises at least one beam positioning device comprising four mirrors as two mirror pairs for positioning the at least one pulsed laser beam, wherein each of the four mirrors is rotatable about exactly one axis of rotation, the axes of rotation of the two mirrors of a first mirror pair are aligned along a first spatial direction, and the axes of rotation of the two mirrors of a second mirror pair are aligned along a second spatial direction.

2. The EUV light source as claimed in claim 1 , wherein the first spatial direction and the second spatial direction are perpendicular to each other.

3. The EUV light source as claimed in claim 1 , wherein the two mirrors of the first mirror pair immediately follow one another in a beam path.

4. The EUV light source as claimed in claim 3 , wherein a distance between the two mirrors of the first mirror pair is less than 150 mm.

5. The EUV light source as claimed in claim 1 , wherein the two mirrors of the second mirror pair immediately follow one another in a beam path.

6. The EUV light source as claimed in claim 5 , wherein a distance between the two mirrors of the second mirror pair is less than 150 mm.

7. The EUV light source as claimed in claim 3 , wherein a first mirror of the second mirror pair is arranged in the beam path upstream of the first mirror pair and a second mirror of the second mirror pair is arranged in the beam path downstream of the first mirror pair.

8. The EUV light source as claimed in claim 1 , wherein the beam positioning device comprises at least one galvanometer drive for the rotation of one of the four mirrors about the respective axis of rotation.

9. The EUV light source as claimed in claim 1 , further comprising:

at least one beam position detection device for detecting a spatial pose of the at least one pulsed laser beam, and

at least one closed-loop controller for controlling the spatial pose of the at least one pulsed laser beam by using the at least one beam positioning device.

10. The EUV light source as claimed in claim 1 , wherein a deflection angle of the pulsed laser beam at at least one of the four mirrors lies in an angular range of between 30° and 90°.

11. The EUV light source as claimed in claim 1 , wherein a deflection angle of the pulsed laser beam at at least one of the four mirrors lies in an angular range of between 60° and 90°.

12. The EUV light source as claimed in claim 1 , wherein a front side of at least one of the four mirrors has a reflective coating for the pulsed laser beam.

13. The EUV light source as claimed in claim 1 , wherein a back side of at least one of the four mirrors has an anti-reflective coating for the at least one pulsed laser beam.

14. The EUV light source as claimed in claim 1 , wherein a substrate of at least one of the four mirrors has a low absorption for the at least one pulsed laser beam.

15. The EUV light source as claimed in claim 1 , wherein the beam guidance device is configured to supply the pulsed laser beam to the beam positioning device in a collimated or divergent form.

Assignments (2)
CHANGE OF NAME Recorded Nov 13, 2024
From: TRUMPF LASERSYSTEMS FOR SEMICONDUCTOR MANUFACTURING GMBH
To: TRUMPF LASERSYSTEMS FOR SEMICONDUCTOR MANUFACTURING SE
Reel/Frame 069352/0522 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2024
From: LAMBERT, MARTIN; REGAARD, BORIS; ERGIN, TOLGA; SCHLOSSER, OLIVER
To: TRUMPF LASERSYSTEMS FOR SEMICONDUCTOR MANUFACTURING GMBH
Reel/Frame 067635/0803 →
Continuity (2)
Continuation PCTEP2021079514 · Oct 25, 2021
Related Publication 20240357726A1 · Oct 24, 2024