Wordline leakage test management
A memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. A first result of the first wordline leakage test is determined. A second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. A determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. A determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. In response to satisfaction of the conditions, an action is executed.
1 . A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
determining that a media endurance metric associated with a memory block of the memory device is greater than a media endurance metric threshold level;
in response to determining that the media endurance metric associated with the memory block is greater than the media endurance metric threshold level, determining that a temperature of the memory block of the memory device is within a threshold temperature range;
in response to determining that the temperature is within the threshold temperature range:
causing execution of an erase operation to produce an erased memory block; and
causing execution of a wordline leakage test of each wordline group of a set of wordline groups of the erased memory block;
determining a result of the wordline leakage test of each wordline group of the set of wordline groups;
determining the result of the wordline leakage test of each wordline group of the set of wordline groups satisfies a condition; and
executing an action in response to the result of the wordline leakage test of each wordline group of the set of wordline groups satisfying the condition.
2 . The system of claim 1 , wherein the condition is satisfied when each wordline group passes the wordline leakage test.
3 . The system of claim 1 , wherein the action comprises releasing the erased memory block to a garbage collection pool associated with the memory device.
4 . The system of claim 1 , wherein the action is executed following determining that a last wordline group of the set of wordline groups satisfies the condition.
5 . The system of claim 1 , wherein the media endurance metric-comprises a program/erase cycle (PEC) count.
6 . A method comprising:
determining that a media endurance metric associated with a memory block of a memory device is greater than a media endurance metric threshold level;
in response to determining that the media endurance metric associated with the memory block is greater than the media endurance metric threshold level, determining that a temperature of the memory block of the memory device is within a threshold temperature range;
in response to determining that the temperature is within the threshold temperature range:
causing execution of an erase operation to produce an erased memory block; and
causing execution of a wordline leakage test of each wordline group of a set of wordline groups of the erased memory block;
determining a result of the wordline leakage test of each wordline group of the set of wordline groups;
determining the result of the wordline leakage test of each wordline group of the set of wordline groups satisfies a condition; and
executing an action in response to the result of the wordline leakage test of each wordline group of the set of wordline groups satisfying the condition.
7 . The method of claim 6 , wherein the condition is satisfied when each wordline group of the set of wordline groups passes the wordline leakage test.
8 . The method of claim 6 , wherein the action comprises releasing the erased memory block to a garbage collection pool associated with the memory device.
9 . The method of claim 6 , wherein the action is executed following determining that a last wordline group of the set of wordline groups satisfies the condition.
10 . The method of claim 6 , wherein the media endurance metric-comprises a program/erase cycle (PEC) count.
11 . A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
determining that a media endurance metric associated with a memory block of a memory device is greater than a media endurance metric threshold level;
in response to determining that the media endurance metric associated with the memory block is greater than the media endurance metric threshold level, determining that a temperature of the memory block is within a threshold temperature range;
in response to determining that the temperature is within the threshold temperature range:
causing execution of an erase operation to produce an erased memory block; and
causing execution of a wordline leakage test of each wordline group of a set of wordline groups of the erased memory block;
determining a result of the wordline leakage test of each wordline group of the set of wordline groups;
determining the result of the wordline leakage test of each wordline group of the set of wordline groups satisfies a condition; and
executing an action in response to the result of the wordline leakage test of each wordline group of the set of wordline groups satisfying the condition.
12 . The non-transitory computer-readable storage medium of claim 11 , wherein the condition is satisfied when each wordline group of the set of wordline groups passes the wordline leakage test.
13 . The non-transitory computer-readable storage medium of claim 11 , wherein the action comprises releasing the erased memory block to a garbage collection pool associated with the memory device.
14 . The non-transitory computer-readable storage medium of claim 11 , wherein the action is executed following determining that a last wordline group of the set of wordline groups satisfies the condition.
15 . The non-transitory computer-readable storage medium of claim 11 , wherein the media endurance metric-comprises a program/erase cycle (PEC) count.