Sequential garbage collection
An example apparatus for sequential garbage collection can include a memory device including a plurality of memory blocks associated with a plurality of logical block addresses (LBAs). The example apparatus can include a controller coupled to the memory device. The controller can be configured to monitor a quantity of read operations and a quantity of write operations associated with a plurality of command sizes performed on a portion of the plurality of memory blocks. The controller can be configured to monitor a quantity of read operations and a quantity of write operations associated with a particular LBA. The controller can be configured to determine a type of garbage collection operation to perform based on the monitoring.
1 . An apparatus, comprising:
a memory device comprising a plurality of memory blocks associated with a plurality of logical block addresses (LBAs);
a controller coupled to the memory device and configured to:
monitor a quantity of read operations and a quantity of write operations performed on a portion of the plurality of memory blocks; and
determine a type of garbage collection operation to perform based on a threshold ratio of the quantity of read operations to the quantity of write operations.
2 . The apparatus of claim 1 , wherein the controller is configured to perform a sequential garbage collection operation in response to a determined ratio of the quantity of read operations to the quantity of write operations being above the threshold ratio.
3 . The apparatus of claim 1 , wherein the controller is configured to perform a non-sequential garbage collection operation in response to a determined ratio of the quantity of read operations to the quantity of write operations being below the threshold ratio.
4 . The apparatus of claim 1 , wherein the controller is configured to monitor a quantity of logical block addresses (LBAs) that are read from a portion of the plurality of memory blocks of the memory device to determine a LBA read counter value.
5 . The apparatus of claim 4 , wherein the controller is configured to monitor a quantity of LBAs that are written to the portion of the plurality of memory blocks of the memory device to determine a LBA write counter value and determine an LBA ratio of the LBA read counter value to the LBA write counter value.
6 . The apparatus of claim 1 , wherein the controller is configured to clear a counter that maintains the quantity of read operations and the quantity of write operations at particular time intervals.
7 . The apparatus of claim 1 , wherein the controller is configured to compare an age of the memory device to an allowed age of the memory device to determine a memory device utilization value, wherein the controller is configured to perform the type of garbage collection operation based on the memory device utilization value.
8 . The apparatus of claim 1 , wherein the controller is configured to determine a ratio of a total quantity of bytes written to an allowed total bytes to be written and adjust the threshold ratio that triggers the type of garbage collection operation to perform.
9 . A method, comprising:
monitoring a quantity of read operations and a quantity of write operations that are performed on a first portion of a plurality of memory blocks of a memory device and associated with corresponding command sizes;
monitoring a quantity of logical block addresses (LBAs) that are read from and a quantity of LBAs that are written to, wherein the quantity of LBAs are read from and the quantity of LBAs written to a second portion of the plurality of memory blocks of the memory device;
determining a ratio of the quantity of read operations to the quantity of write operations; and
determining a type of garbage collection operation to perform based on the ratio.
10 . The method of claim 9 wherein, in response to the ratio being below a threshold ratio, the type of garbage collection operation is a non-sequential garbage collection operation.
11 . The method of claim 9 further comprising determining an LBA ratio of the quantity of LBAs read from to the quantity of LBAs written to.
12 . The method of claim 11 wherein, in response to the LBA ratio being above a threshold LBA ratio, the type of garbage collection operation is a sequential garbage collection operation.
13 . The method of claim 11 , wherein, in response to the LBA ratio being below a threshold LBA ratio, the type of garbage collection operation is a non-sequential garbage collection operation.
14 . The method of claim 9 , further comprising comparing an actual age of the memory device to an allowed total age of the memory device to determine an age ratio.
15 . The method of claim 14 , further comprising comparing an actual total bytes written (TBW) of the memory device to an allowed quantity of TBW of the memory device to determine a TBW ratio.
16 . The method of claim 15 , further comprising performing a non-sequential garbage collection operation in response to the TBW ratio being above a threshold TBW ratio or the age ratio being above a threshold age ratio and performing a sequential garbage collection operation in response to the TBW ratio being below the threshold TBW ratio or the age ratio being below a threshold age ratio.
17 . An apparatus, comprising:
a memory device comprising a plurality of memory blocks associated with a plurality of logical block addresses (LBAs); and
a controller coupled to the memory device and configured to:
monitor a quantity of logical block addresses (LBAs) that are read from a portion of the plurality of memory blocks of the memory device to determine a LBA read counter value;
monitor a quantity of LBAs that are written to the portion of the plurality of memory blocks of the memory device to determine a LBA write counter value;
determine an LBA ratio of the LBA read counter value to the LBA write counter value; and
determine a type of garbage collection operation to perform based on the LBA ratio.
18 . The apparatus of claim 17 , wherein the controller is configured to compare an actual total bytes written (TBW) of the memory device to an allowed quantity of TBW of the memory device to determine a TBW ratio and compare an actual age of the memory device to an allowed total age of the memory device to determine an age ratio.
19 . The apparatus of claim 17 , wherein, in response to the LBA ratio being above a threshold LBA ratio the type of garbage collection operation is a sequential garbage collection operation.
20 . The apparatus of claim 17 , wherein, in response to the LBA ratio being below a threshold LBA ratio the type of garbage collection operation is a non-sequential garbage collection operation.