PROCESSING CORE INCLUDING HIGH CAPACITY LOW LATENCY STORAGE MEMORY
A non-volatile memory stack provides high bandwidth support to a specialized processor such as an AI processor. The high bandwidth flash (HBF) stack may be unitary, including all non-volatile memory together with a memory controller, or it may be hybrid, including a mixture of non-volatile and volatile memory together with a controller. The processor may be mounted on an interposer, and one or more of the HBF stacks and/or hybrid HBF stacks may then be mounted on the interposer alongside the processor.
1 . A semiconductor device, comprising:
a signal carrying medium;
a processing core mounted on the signal carrying medium; and
one or more stacks of high bandwidth flash (HBF) memory mounted on the signal carrying medium, each stack of HBF memory comprising:
a plurality of non-volatile memory dies, and
a controller die;
wherein each stack of HBF memory is electrically coupled to the processing core to provide high bandwidth memory support to the processing core.
2 . The semiconductor device of claim 1 , wherein the plurality of non-volatile memory dies in a stack of the one or more stacks of high bandwidth flash memory comprise NAND memory dies.
3 . The semiconductor device of claim 1 , wherein the plurality of non-volatile memory dies in a stack of the one or more stacks of high bandwidth flash memory comprise CBA memory dies, each CBA memory die comprising a NAND die coupled to a CMOS logic circuit die.
4 . The semiconductor device of claim 1 , wherein a stack of the one or more stacks of HBF memory comprise two or more non-volatile memory dies.
5 . The semiconductor device of claim 1 , wherein the one or more stacks of HBF memory comprise a plurality of stacks of HBF memory adjacent to and surrounding the processing core.
6 . The semiconductor device of claim 5 , further comprising one or more stacks of high bandwidth memory (HBM), each stack of the one or more stacks of HBM comprising a plurality of volatile memory dies.
7 . The semiconductor device of claim 6 , wherein the one or more stacks of HBM comprise a plurality of stacks of HBM adjacent to and surrounding the processing core.
8 . The semiconductor device of claim 1 , wherein each non-volatile memory die in a stack of HBF memory comprises a plurality of planes.
9 . The semiconductor device of claim 8 , wherein the stack of HBF memory further comprises a plurality of signal lines, each plane of the stack of HBF memory having its own set of dedicated signal lines of the plurality of signal lines.
10 . The semiconductor device of claim 9 , wherein the controller is configured to access the plurality of the planes in the non-volatile memory die independently and in parallel via the plurality of signal lines.
11 . The semiconductor device of claim 9 , wherein the set of dedicated signal lines for each plane comprise between eight-bit I/O signal lines and two hundred and fifty-six bit I/O signal lines.
12 . The semiconductor device of claim 1 , wherein the processing core is an artificial intelligence (AI) processing core.
13 . The semiconductor device of claim 12 , further comprising volatile memory electrically coupled to the AI processing core, wherein write operations performed by the AI memory core are written to the volatile memory, and read operations performed by the AI memory core are read from the one or more stacks of HBF.
14 . The semiconductor device of claim 12 , wherein the AI processing core prefetches data from the one or more stacks of HBF memory.
15 . The semiconductor device of claim 1 , wherein a stack of the one or more stacks of HBF memory provides at least two terabytes of storage capacity and provides bandwidth capabilities of at least 1.5 terabytes per second.
16 . A semiconductor device, comprising:
a signal carrying medium;
a processing core mounted on the signal carrying medium;
one or more stacks of hybrid high bandwidth flash (HBF) memory mounted on the signal carrying medium, each stack of hybrid HBF memory comprising:
a plurality of non-volatile memory dies,
a plurality of volatile memory dies, and
a controller die controlling I/O operations to the plurality of non-volatile memory dies in the stack and controlling I/O operations to the plurality of volatile memory dies in the stack;
wherein each stack of hybrid HBF memory is electrically coupled to the processing core to provide high bandwidth memory support to the processing core.
17 . The semiconductor device of claim 16 , wherein the one or more stacks of hybrid HBF memory comprise a plurality of stacks of hybrid HBF memory adjacent to and surrounding the processing core.
18 . The semiconductor device of claim 16 , wherein the processing core is an artificial intelligence (AI) processing core.
19 . The semiconductor device of claim 18 , wherein write operations performed by the AI memory core are written to the volatile memory dies within a stack of the one or more stacks of hybrid HBF, and read operations performed by the AI memory core are read from the non-volatile memory dies within the stack.
20 . A semiconductor device, comprising:
a signal carrying medium;
a processing core mounted on the signal carrying medium; and
memory means, mounted on the signal carrying medium adjacent to the processing core and electrically coupled to the processing core and comprising at least one or more non-volatile memory dies, for providing at least 0.5 terabytes per second bandwidth support to the processing core, and providing at least 256 gigabytes of storage capacity support to the processing core.