IP Library › Granted Patent US 12,748,503
Granted Patent B2
US 12,748,503 · App. 19/412,600 · Granted Sep 29, 2026

Position detection method, position detector, and integrated circuit

Inventors: Fumitaka Goto (Saitama, JP); Hiroshi Mizuhashi (Saitama, JP); Takaya Oyama (Saitama, JP); Joo Hoon Lee (Saitama, JP)
Assignee: Wacom Co., Ltd.
G06F3/03545G06F3/0416G06F3/046G06F3/0442
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Quick Facts
Patent No.
US 12,748,503
App. No.
19/412,600
Granted
Sep 29, 2026
Kind
B2
Abstract

A position detecting method in a position detector is provided. The position detector includes a first sensor coil group and a second sensor coil group. The position detecting method includes a first step of the position detector generating an alternating magnetic field from the first sensor coil group; a second step of the position detector obtaining a level of a pen signal which a pen, having stored the alternating magnetic field, generates as a response alternating magnetic field, by using at least the second sensor coil group; and a third step of the position detector deriving information regarding a position of the pen by using a two-dimensional distribution of the level of the pen signal at each of points of intersection of the plurality of electrodes of the first sensor coil group and the plurality of electrodes of the second sensor coil group.

Claims (13)

1 . A position detecting method in a position detector, the position detector including a first sensor coil group including a plurality of conducting wires having a plurality of electrodes arranged in parallel with each other in a first direction and a second sensor coil group including a plurality of conducting wires having a plurality of electrodes arranged in parallel with each other in a second direction intersecting the first direction, the position detecting method comprising:

a first step of the position detector generating an alternating magnetic field from the first sensor coil group;

a second step of the position detector obtaining a level of a pen signal which a pen, having stored the alternating magnetic field, generates as a response alternating magnetic field, by using at least the second sensor coil group;

a third step of the position detector deriving information regarding a position of the pen by using a two-dimensional distribution of the level of the pen signal at each of points of intersection of the plurality of electrodes of the first sensor coil group and the plurality of electrodes of the second sensor coil group;

a fourth step of the position detector obtaining a first reference position, which corresponds to a first peak in the two-dimensional distribution and which is a position indicated by a pen tip of the pen;

a fifth step of the position detector obtaining an upwardly displaced or downwardly displaced second reference position, which corresponds to a second peak in the two-dimensional distribution, the second peak being different from the first peak and having the same sign as the second peak; and

a sixth step of the position detector deriving, on a basis of a direction of the second reference position with respect to the first reference position, a direction of an inclination of the pen on the sensor plane, which is an angle on the sensor plane formed by a projection of the pen on the sensor plane.

2 . The position detecting method according to claim 1 , wherein

the third step includes

a seventh step of the position detector deriving the an inclination of the pen with respect to a normal to the sensor plane on a basis of a level strength of the pen signal at the first reference position and a level strength of the pen signal at the second reference position.

3 . The position detecting method according to claim 1 , wherein the first step includes

an eighth step of the position detector generating the alternating magnetic field by using the first sensor coil group a predetermined number of times while changing positions of the alternating magnetic field in the first direction, and

a ninth step of the position detector obtaining the level of the pen signal which the pen, having stored the alternating magnetic field, generates as the response alternating magnetic field, for the predetermined number of times, and determining the next order of scanning the predetermined number of times such that one conducting wire corresponding to a highest level of the signal from the pen, among the plurality of conducting wires arranged in parallel with each other in the first direction in the first sensor coil group, is set as a start position.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2025
From: GOTO, FUMITAKA; MIZUHASHI, HIROSHI; OYAMA, TAKAYA; LEE, JOO HOON
To: WACOM CO., LTD.
Reel/Frame 073241/0962 →
Priority Claims (1)
JP 2023-173294 · Oct 5, 2023 · national
Continuity (3)
Continuation PCTJP2024023263 · Jun 24, 2024
Provisional Application 63510440 · Jun 27, 2023
Related Publication 20260111079A1 · Apr 23, 2026
References Cited (65)
US 5748110A · Sekizawa · 1998 [cited by examiner]
US 5751229A · Funahashi · 1998 [cited by examiner]
US 10180736B2 · Krumpelman · 2019 [cited by examiner]
US 10331235B2 · Fleck · 2019 [cited by examiner]
US 11209938B2 · Nomura · 2021 [cited by examiner]
US 11604521B2 · Maeyama · 2023 [cited by examiner]
US 11816292B2 · Nomura · 2023 [cited by examiner]
US 11841999B2 · Maeyama · 2023 [cited by examiner]
US 12026326B2 · Maeyama · 2024 [cited by examiner]
US 12216846B2 · Maeyama · 2025 [cited by examiner]
US 12236054B1 · Lim · 2025 [cited by examiner]
US 12265668B2 · Maeyama · 2025 [cited by examiner]
US 12314516B2 · Nomura · 2025 [cited by examiner]
US 12524087B2 · Maeyama · 2026 [cited by examiner]
US 20160098127A1 · Wilson · 2016 [cited by examiner]
US 20160147320A1 · Krumpelman · 2016 [cited by examiner]
US 20170024037A1 · Ishizaki et al. · 2017 [cited by applicant]
US 20180260061A1 · Hirota · 2018 [cited by applicant]
US 20200225773A1 · Yamamoto et al. · 2020 [cited by applicant]
US 20200333939A1 · Nomura · 2020 [cited by examiner]
US 20210208709A1 · Shin et al. · 2021 [cited by applicant]
US 20210389833A1 · Maeyama · 2021 [cited by examiner]
US 20220091632A1 · Hong et al. · 2022 [cited by applicant]
US 20220107703A1 · Lee et al. · 2022 [cited by applicant]
US 20220113856A1 · Nomura · 2022 [cited by examiner]
US 20230071229A1 · Lee et al. · 2023 [cited by applicant]
US 20230146504A1 · Maeyama · 2023 [cited by examiner]
US 20240036681A1 · Nomura · 2024 [cited by examiner]
US 20240053835A1 · Maeyama · 2024 [cited by examiner]
US 20240111372A1 · Maeyama · 2024 [cited by examiner]
US 20240310933A1 · Maeyama · 2024 [cited by examiner]
US 20250094011A1 · Mizuhashi · 2025 [cited by examiner]
US 20250147603A1 · Maeyama · 2025 [cited by examiner]
US 20250199628A1 · Maeyama · 2025 [cited by examiner]
US 20250264946A1 · Moon et al. · 2025 [cited by applicant]
US 20250264965A1 · Nomura · 2025 [cited by examiner]
US 20250355527A1 · Mizuhashi · 2025 [cited by examiner]
US 20250362770A1 · Mizuhashi · 2025 [cited by examiner]
US 20260086682A1 · Nomura · 2026 [cited by examiner]
US 20260093350A1 · Lee · 2026 [cited by examiner]
JP H07295729A · 1995 [cited by applicant]
JP 2000099259A · 2000 [cited by applicant]
JP 2002244806A · 2002 [cited by applicant]
JP 2007157107A · 2007 [cited by applicant]
JP 2012133704A · 2012 [cited by applicant]
JP 2014035631A · 2014 [cited by applicant]
JP 2018147348A · 2018 [cited by applicant]
JP 2018185559A · 2018 [cited by applicant]
JP 2019091291A · 2019 [cited by applicant]
JP 2019121330A · 2019 [cited by applicant]
JP 6612075B2 · 2019 [cited by applicant]
JP 2021103459A · 2021 [cited by applicant]
JP 2021157849A · 2021 [cited by applicant]
JP 2021168204A · 2021 [cited by applicant]
JP 2021193625A · 2021 [cited by applicant]
JP 2022012385A · 2022 [cited by applicant]
KR 1020140003067A · 2014 [cited by applicant]
KR 1020220096768A · 2022 [cited by applicant]
KR 1020230041449A · 2023 [cited by applicant]
WO 2020202352A1 · 2020 [cited by applicant]
International Search Report, mailed Aug. 13, 2024, for International Application No. PCT/JP2024/023084. (4 pages). [cited by applicant]
Written Opinion of the International Searching Authority, mailed Aug. 13, 2024, for International Application No. PCT/JP2024/023084. (6 pages). [cited by applicant]
International Search Report, mailed Sep. 10, 2024, for corresponding International Application No. PCT/JP2024/023263. (5 pages)(with Translation). [cited by applicant]
International Search Report, mailed Sep. 17, 2024, for corresponding International Application No. PCT/JP2024/023181. (7 pages)(with Translation). [cited by applicant]
Notice of Reasons for Refusal, mailed Jan. 28, 2025, for corresponding Japanese Patent Application No. 2024-559116. (12 pages)(with Translation). [cited by applicant]