Method and apparatus for wafer scale testing

Inventor: Morgan T. Johnson

Provisional Application Expired

	Code	Description	Pages	PDF
2001-06-21	`TRNA`	Transmittal of New Application	1	View
2001-06-21	`SPEC`	Specification	11	View
2001-06-21	`ABST`	Abstract	1	View
2001-06-21	`DRW`	Drawings-only black and white line drawings	4	View

Inventors

Morgan T. Johnson Portland, OR

Attorneys & Agents of Record

RALPH HOPPIN Reg. 38494 Attorney · SCHWABE, WILLIAMSON & WYATT

LANCE TERMES Reg. 43184 Attorney · SCHWABE, WILLIAMSON & WYATT PC

ERIC BLANK Reg. 68748 Attorney · SCHWABE WILLIAMSON & WYATT

MICHAEL BERNADICOU Reg. 35934 Attorney · SCHWABE, WILLIAMSON & WYATT

XIONGYING TU Reg. 73446 Attorney

MICHAEL COFIELD Reg. 54630 Attorney · SCHWABE, WILLIAMSON & WYATT

STEVEN PREWITT Reg. 45023 Attorney · SCHWABE, WILLIAMSON & WYATT

JUSTIN BRASK Reg. 61080 Attorney · SCHWABE WILLIAMSON & WYATT PC

STEPHEN SULLIVAN Reg. 38329 Attorney · SCHWABE, WILLIAMSON & WYATT

GRACIELA COWGER Reg. 42444 Attorney · SCHWABE WILLIAMSON & WYATT

ANN BERNERT Reg. 79168 Agent · KLARQUIST SPARKMAN, LLP

JEFF LIAO Reg. 83482 Attorney · SCHWABE, WILLIAMSON & WYATT

Prosecution

No recorded assignments were found for this patent.

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