IP Library › Granted Patent US 6,737,879
Granted Patent Utility Small
US 6,737,879 · Confirmation No. 1283

METHOD AND APPARATUS FOR WAFER SCALE TESTING

Inventor: Morgan T. Johnson
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Quick Facts
Patent No.
US 6,737,879
App. No.
10/176,571
Filed
2002-06-21
Granted
2004-05-18
Pub. No.
US20020196046A1
Art Unit
2829
PTA
-85 days