IP Library › Granted Patent US 6,836,130
Granted Patent Utility Small
US 6,836,130 · Confirmation No. 4384

METHOD AND APPARATUS FOR WAFER SCALE TESTING

Inventor: Morgan T. Johnson
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Quick Facts
Patent No.
US 6,836,130
App. No.
10/633,011
Filed
2003-08-01
Granted
2004-12-28
Pub. No.
US20040027151A1
Art Unit
2829
PTA
0 days