Change of Name

Recorded: 2009-09-04 Received: 2009-09-08 Pages: 3

Assignor

OCTAVIAN SCIENTIFIC, INC.

Executed: 2007-12-18

Assignee

ADVANCED INQUIRY SYSTEMS, INC

20520 NW EVERGREEN PARKWAY, SUITE 100, HILLSBORO, OR, 97124, UNITED STATES

Covered Properties (6)

Laser isolation of metal over alumina underlayer and structures formed thereby

Application: 11/811,880 →

Desktop wafer analysis station

Application: 11/729,039 →

Full Wafer Contacter and Applications Thereof

Application: 10/789,305 →

Method and Apparatus for Wafer Scale Testing

Application: 10/633,011 →

Methods and Apparatus for Addition of Electrical Conductors to Previously Fabricated Device

Application: 10/370,393 →

Method and Apparatus for Wafer Scale Testing

Application: 10/176,571 →