Patent Application
Provisional
App. No. 61/862,801
· Confirmation No. 9625
Method of Patterned Wafer Characterization
Provisional Application Expired
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2013-08-21 | APP.FILE.REC |
Filing Receipt | 3 | View | |
| 2013-08-06 | TR.PROV |
Provisional Cover Sheet (SB16) | 3 | View | |
| 2013-08-06 | SPEC |
Specification | 9 | View | |
| 2013-08-06 | CLM |
Claims | 2 | View | |
| 2013-08-06 | WFEE |
Fee Worksheet (SB06) | 2 | View | |
| 2013-08-06 | N417 |
Electronic Filing System Acknowledgment Receipt | 2 | View |
Inventors
Thaddeus Gerard Dziura
San Jose, CA
Stilian Ivanov Pandev
Santa Clara, CA
Alexander Kuznetsov
Mountain View, CA
Andrei V. Shchegrov
Campbell, CA
Attorneys & Agents of Record
Prosecution
- Customer No.
- 23584
- Docket No.
- P4262
- Confirmation No.
- 9625
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2014-09-19
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Quick Facts
- App. No.
- 61/862,801
- Filed
- 2013-08-06
External Links