Patent Assignment
Reel/Frame 033777/0062
Assignment of Assignor's Interest
Recorded: 2014-09-19
Pages: 4
Assignors
DZIURA, THADDEUS GERARD
Executed: 2014-08-15
PANDEV, STILIAN IVANOV
Executed: 2014-08-15
KUZNETSOV, ALEXANDER
Executed: 2014-08-25
SHCHEGROV, ANDREI V.
Executed: 2014-08-15
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(3)
Methods and Apparatus for Patterned Wafer Characterization
Method of Patterned Wafer Characterization
Application:
61/862,801 →
Method of Patterned Wafer Characterization
Application:
61/943,098 →