IP Library › Patent Application 61893341
Patent Application Provisional
App. No. 61/893,341 · Confirmation No. 7749

Small-Angle Scattering X-ray Metrology System and Method With Optimized Illumination Optics

Provisional Application Expired
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 Code Description Pages PDF
2013-11-12 APP.FILE.REC Filing Receipt 3 View
2013-10-21 TR.PROV Provisional Cover Sheet (SB16) 4 View
2013-10-21 SPEC Specification 10 View
2013-10-21 CLM Claims 2 View
2013-10-21 WFEE Fee Worksheet (SB06) 2 View
2013-10-21 N417 Electronic Filing System Acknowledgment Receipt 2 View
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Quick Facts
App. No.
61/893,341
Filed
2013-10-21