Super resolution microscope
View Patent ↗A microscope includes a first light source to emit a first light to excite a molecule of a sample to a higher energy level vibration state which belongs to a lowest energy level electron state from the ground state, a second light source to emit a second light source to excite the molecule to a higher energy level quantum state from the higher energy vibration state, an optical system to overlap the first light and the second light partially on the sample, and an optical detector to detect a given fluorescence from the irradiated region of the first light and the second light on the sample.
1. A super resolution microscope comprising:
a first light source to emit a first light to excite a molecule of a sample from a ground state to a higher energy level vibration state which belongs to a lowest energy level electron state,
a second light source to emit a second light to excite said molecule from said higher energy vibration state to a higher energy level quantum state,
a phase modulate filter system for spatially modulating an intensity of said first and second lights,
an optical system to overlap a part of an irradiation region of said first light and a part of an irradiation region of said second light partially on said sample, such that an overlapped portion of the irradiated regions of the first and second lights modulated in intensity by the phase modulate filter system is narrower than beam sizes of the first and the second lights, and
an optical detector to detect a given fluorescence from the irradiated region of said first light and said second light overlapped by said optical system on said sample,
wherein a resolution of the overlapped portion of the irradiated regions is higher than a resolution of the beam sizes of the first and second lights.
2. The super resolution microscope of claim 1 , wherein said first light source emits one of an infrared light and a near infrared light which has a wavelength of at least 700 nm.
3. The super resolution microscope of claim 1 , wherein at least one of said first light source and said second light source comprises a pulsed light source.
4. The super resolution microscope of claim 3 , wherein said first light source and said second light source comprise coherent light sources, respectively.
5. The super resolution microscope of claim 4 , wherein at least one of said first light source and said second light source comprises a wavelength-variable light source.
6. The super resolution microscope of claim 1 , wherein a wavelength of said first light is set to one of a fundamental vibration and over tone of vibration of a chemical group selected from the group consisting of —CH, —NH, —OH, C═C, C═O, —CH 2 , —CHOH and —CN.
7. The super resolution microscope of claim 1 , wherein said optical detector detects a difference between a luminance detected from said sample when said first light and said second light are irradiated onto said sample so as to be partially overlapped on said sample and a luminance detected from said sample when only said second light is irradiated onto said sample.
8. The super resolution microscope of claim 7 , wherein said first light source and said second light source comprise pulsed light sources having a same pulse frequency, and wherein a pulse width of said second light from said second light source is set larger than a pulse width of said first light from said first light source.
9. The super resolution microscope of claim 7 , wherein said first light source and said second light source comprise pulsed light sources having a same pulse frequency, and wherein a pulse frequency of said second light source is set to integral number multiples of a pulse frequency of said first light source so that said first light source and said second light source oscillate simultaneously.
10. The super resolution microscope of claim 7 , wherein a background luminance is detected by scanning said second light on said sample and detecting one of a luminance and a scattered light from said sample, wherein a signal luminance is detected by scanning said first light and said second light simultaneously on said sample and detecting from said sample, and wherein said signal luminance is subtracted by said background luminance, to obtain the inherent signal luminance.
11. The super resolution microscope of claim 1 , wherein said phase modulate filter system comprises a plurality of regions for modulating a phase of said first and second lights, respectively, to another phase.
12. The super resolution microscope of claim 11 , wherein in a region adjacent to said plurality of regions of said phase modulate filter system, phase modulation is performed so as to effect a phase shift by π.