IP Library › Granted Patent US 6,884,660
Granted Patent B2
US 6,884,660 · App. 10/316,078 · Granted Apr 26, 2005

Thermoconducting silicone composition, its curing product and installation method, and a heat dissipating structure of a semiconductor device using same

Assignee: Shin-Etsu Chemical Co., Ltd.
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Quick Facts
Patent No.
US 6,884,660
App. No.
10/316,078
Granted
Apr 26, 2005
Kind
B2
Abstract

The present invention relates to a thermoconducting silicone composition having a viscosity at 25° C. before curing of 10-1,000 Pa·s, a method of installing the composition, and a heat dissipating structure comprising the silicone composition.

Claims (35)

1. A thermoconducting silicone composition comprising the following components (A)-(F), whereof the viscosity at 25° C. before curing is 10-1000 Pa·s:

Component (A): 100 weight parts of an organopolysiloxane having at least two alkenyl groups in the molecule, and a viscosity of 10-100,000 mm 2 /s a 25° C.,

Component (B): An organohydrogenpolysiloxane having at least two hydrogen atoms bonded directly to silicon atoms in the molecule, in an amount such that (total number of hydrogen atoms bonded directly to silicon atoms/total number of alkenyl group in Component (A) is 0.5-5.0,

Component (C): A low melting metal powder having a melting point of 40-250° C., and an average particle size of 0.1-100 micrometers,

Component (D): A highly thermoconducting filler having a melting point of more than 250° C., and an average particle size of 0.1-100 micrometers,

the total amount of component (C) and Component (D) being 800-2,200 weight parts, and (C)/((C)+(D))=0.05-0.9,

Component (E): A catalytic platinum selected from group comprising platinum and platinum compounds,

0.1-500 ppm relative to Component (A) calculated in terms of platinum atom,

Component (F): 0.001-5 weight parts of a controlling agent which suppresses the catalytic activity of Component (E).

2. The thermoconducting silicone composition according to claim 1 , further comprising 0.01-10 weight parts of an organosilane (Component (G)) represented by the following general formula (1) relative to 100 parts of Component (A):

R 1 a R 2 b Si(OR 3 ) 4−a−b   (1)

wherein R 1 is an alkyl group having 6-15 carbon atoms, R 2 is a monovalent hydrocarbon group having 1-8 carbon atoms, and R 3 is an alkyl group having 1-6 carbon atoms, these groups being identical or different, a is an integer in the range 1-3, b is an integer in the range 0-2, and a+b is an integer in the range 1-3.

3. The thermoconducting silicone composition according to claim 2 , further comprising 0.05-20 weight parts of a flux (H) relative to 100 weight parts of Component (A).

4. A thermoconducting silicone composition according to claim 2 , wherein the organosilane is of the formula:

C 6 H 13 Si(OCH 3 ) 3 , C 10 H 21 Si(OCH 3 ) 3 , C 10 H 25 Si(OCH 3 ) 3 ,

C 10 H 25 Si(OC 2 H 5 ) 3 ,

C 10 H 21 Si(C 6 H 5 )(OCH 3 ) 2 , C 10 H 21 Si(CH 3 )(OC 2 H 5 ) 2 , C 10

H 21 Si(CH═CH 2 )(OCH 3 ) 2 , or

C 10 H 21 Si(CH 2 CH 2 CF 3 )(OCH 3 ) 2 .

5. The thermoconducting silicone composition according to claim 1 , formed by dispersion and mixing at a temperature below the melting point of Component (C).

6. A thermoconducting silicone curing product formed by heat curing the thermoconducting silicone composition of claim 1 at a temperature below the melting point of Component (C), and then heating to a temperature above the melting point of Component (C) to dissolve Component (C).

7. A method for installing the thermoconducting silicone composition of claim 1 between an IC package and a heat dissipating body, comprising the following steps 1, 2, 3, 4 in sequence:

Step 1: Coating a predetermined amount of the thermoconducting silicone composition on the IC package;

Step 2: Mounting a heat dissipating fin on the thermoconducting silicone composition, and fixing the fin;

Step 3: Curing the thermoconducting silicone composition at a temperature below the melting point of Component (C); and

Step 4: Heating the curing product of the thermoconducting silicone composition at a temperature above the melting point of Component (C).

8. A heat dissipating structure of a semiconductor device comprising an IC package mounted on a printed circuit board, and a heat dissipating body installed on the surface of this IC package, wherein the curing product of the thermoconducting silicone composition of claim 1 is interposed between the surface of the IC package and the teat dissipating body.

9. A thermoconducting silicone composition according to claim 1 , wherein the total number of hydrogen atoms bonded directly to silicon atoms/total number of alkenyl groups in component (A) is about 1.0-about 30.

10. A thermoconducting silicone composition according to claim 1 , wherein the metal powder has a melting point of about 100-about 220° C.

11. A thermoconducting silicone composition according to claim 1 , wherein the metal power has average particle size of about 20-about 50 micrometers.

12. A thermoconducting silicone composition according to claim 1 , wherein the metal powder is indium, tin, a malott's metal alloy comprising bismuth, lead, tin or antimony, a ceromatrix alloy, a solder, a wood's metal or a cerolo alloy comprising tin, lead, bismuth, indium, cadmium, zinc, silver, or antimony, or an aluminium solder comprising aluminium, zinc, tin, lead or cadmium.

13. A thermoconducting silicone composition according to claim 1 , wherein the filler has an average particle size of about 1-about 20 micrometers.

14. A thermoconducting silicone composition according to claim 1 , wherein the proportion of the Component (C) contained in the total Components (C) and (D) is about 0.2-about 08.

15. A thermoconducting silicone composition according to claim 1 , further comprising a flux component comprising an inorganic acid, an inorganic salt, an organic acid, an organic acid salt, an amine, an amine halide acid salt, or a resin.

16. A thermoconducting silicone composition according to claim 15 , wherein the flux component is blended and kneaded below the melting point of Component (C).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2002
From: TETSUKA, HIROAKI; YAMADA, KUNIHIRO; MITA, KUNIHIKO
To: SHIIN-ETSU CHEMICAL CO., LTD.
Reel/Frame 013574/0154 →
Priority Claims (1)
JP 2001-376844 · Dec 11, 2001 · national
Continuity (1)
Related Publication 20030127496A1 · Jul 10, 2003