IP Library › Granted Patent US 6,980,206
Granted Patent B2
US 6,980,206 · App. 09/878,051 · Granted Dec 27, 2005

Rendering a three-dimensional model using a dither pattern

Assignee: Intel Corporation
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Quick Facts
Patent No.
US 6,980,206
App. No.
09/878,051
Granted
Dec 27, 2005
Kind
B2
Abstract

Rendering a three-dimensional model includes obtaining a characteristic of the three-dimensional model, determining a three-dimensional dither pattern based on the characteristic, and rendering the three-dimensional model using the three-dimensional dither pattern. Determining the three-dimensional dither pattern may include selecting a number of points to make up the dither pattern and a location of the points on the three-dimensional model.

Claims (38)

1. A method of rendering a three-dimensional model comprised of volumetric three-dimensional data, comprising:

obtaining a characteristic of a region of the three-dimensional model;

determining a three-dimensional dither pattern for the region based on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and

rendering a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model.

2. The method of claim 1 , wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.

3. The method of claim 1 , wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.

4. The method of claim 1 , wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.

5. The method of claim 4 , wherein the pixels define individual points in the three-dimensional dither pattern.

6. The method of claim 1 , wherein the characteristic comprises a density of the three-dimensional model.

7. The method of claim 6 , wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.

8. The method of claim 1 , wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.

9. The method of claim 1 , wherein determining the three-dimensional dither pattern comprises selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.

10. An article comprising a machine-readable medium that stores executable instructions for rendering a three-dimensional model comprised of volumetric three-dimensional data, the instructions causing a machine to:

obtain a characteristic of a region of the three-dimensional model;

determine a three-dimensional dither pattern based for the region on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and

render a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model.

11. The article of claim 10 , wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.

12. The article of claim 10 , wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.

13. The article of claim 10 , wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.

14. The article of claim 13 , wherein the pixels define individual points in the three-dimensional dither pattern.

15. The article of claim 10 , wherein the characteristic comprises a density of the three-dimensional model.

16. The article of claim 15 , wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.

17. The article of claim 10 , wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.

18. The article of claim 10 , wherein determining the three-dimensional dither pattern comprises selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.

19. An apparatus for rendering a three-dimensional model comprised of three-dimensional volumetric data, comprising:

a memory that-stores executable instructions; and

a processor that executes the instructions to:

obtain a characteristic of a region of the three-dimensional model;

determine a three-dimensional dither pattern for the region based on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and

render a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model.

20. The apparatus of claim 19 , wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.

21. The apparatus of claim 19 , wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on the characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.

22. The apparatus of claim 19 , wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.

23. The apparatus of claim 22 , wherein the pixels define individual points in the three-dimensional dither pattern.

24. The apparatus of claim 19 , wherein the characteristic comprises a density of the three-dimensional model.

25. The apparatus of claim 24 , wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.

26. The apparatus of claim 19 , wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.

27. The apparatus of claim 19 , wherein determining the three-dimensional dither pattern comprises, selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2001
From: CRONIN, THOMAS M.
To: INTEL CORPORATION
Reel/Frame 011897/0023 →
Continuity (1)
Related Publication 20020186215A1 · Dec 12, 2002