IP Library › Granted Patent US 7,015,701
Granted Patent B2
US 7,015,701 · App. 10/382,732 · Granted Mar 21, 2006

Highly time resolved impedance spectroscopy

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,015,701
App. No.
10/382,732
Granted
Mar 21, 2006
Kind
B2
Abstract

A highly time resolved impedance spectroscopy enhances measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage signal is used as the perturbation signal, non-stationary time to frequency transformation algorithms are used when processing the measured time signals of the voltage and current to determine impedance spectra which are localized in time; and the system-characterizing quantities are determined from the impedance spectra using equivalent circuit fitting in a time-resolution-optimized form. Also provided are measuring cells and methods for measuring impedance spectra of biofunctional molecules and aggregates.

Claims (16)

1. An apparatus for measuring impedance spectra with high time resolution comprising:

a measuring cell comprising one or more electrodes, wherein at least one of the electrodes is modified by coupling thereto biofunctional molecules or aggregates;

a memory device configured to store program instructions for generating a perturbation signal and operations to process and evaluate measured data;

at least one analog to digital converter configured to receive a signal representing a perturbation signal and to output a digital value representing the perturbation signal, and to receive a signal representing a system response to the perturbation signal by the measuring cell and to output a digital value representing the system response; and

a processor configured to receive the digital values output by the at least one analog to digital converter, and to receive the program instructions to process and evaluate measured data from the memory device, and to output a perturbation signal and an impedance spectrum, wherein the program instructions to process and evaluate measured data uses a non-stationary time to frequency transformation.

2. The apparatus of claim 1 comprising a plurality of measuring cells.

3. The apparatus of claim 2 wherein the plurality of measuring cells enable parallel data acquisition and analysis.

4. The apparatus of claim 2 wherein the plurality of measuring cells enable sequential data acquisition and analysis.

5. An apparatus for measuring impedance spectra with high time resolution comprising:

a measuring cell comprising a substrate bearing one or more electrodes and a lipid membrane support;

a memory device configured to store program instructions for generating a perturbation signal and operations to process and evaluate measured data;

at least one analog to digital converter configured to receive a signal representing a perturbation signal and to output a digital value representing the perturbation signal, and to receive a signal representing a system response to the perturbation signal by the measuring cell and to output a digital value representing the system response; and

a processor configured to receive the digital values output by the at least one analog to digital converter, and to receive the program instructions to process and evaluate measured data from the memory device, and to output a perturbation signal and an impedance spectrum, wherein the program instructions to process and evaluate measured data uses a non-stationary time to frequency transformation.

6. The apparatus of claim 5 comprising a plurality of measuring cells.

7. The apparatus of claim 6 wherein the plurality of measuring cells enable parallel data acquisition and analysis.

8. The apparatus of claim 6 wherein the plurality of measuring cells enable sequential data acquisition and analysis.

Priority Claims (2)
DE 199 49 107 · Oct 12, 1999 · national
DE 100 18 745 · Apr 15, 2000 · national
Continuity (2)
Continuation 0967570500 · Sep 29, 2000
Related Publication 20030173976A1 · Sep 18, 2003