IP Library Granted Patent US 7,034,629
Granted Patent B2
US 7,034,629 · App. 10/331,478 · Granted Apr 25, 2006

High frequency, high reflection pre-matching tuners with variable zero initialization

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Quick Facts
Patent No.
US 7,034,629
App. No.
10/331,478
Granted
Apr 25, 2006
Kind
B2
Abstract

Automatic microwave pre-matching tuners with new zero positioning capability allowing for a minimum idle airline section between pre-matching and tuning section, thus minimizing insertion loss and enhancing high reflection tuning capability at high frequencies and tuner calibration algorithm of the pre-matching section over one half of a wavelength and of the tuning section over one full wavelength at each operation frequency and associated tuning and measurement operation algorithms.

Claims (3)

1. An automatic RF impedance tuner comprising an input port and an output port, a slotted airline connecting both ports, means of remotely positioning two independent mobile carriages carrying a wideband RF probe each, said probes being a primary, or pre-matching probe and a secondary, or tuning probe, said probes can be inserted into the slot and moved parallel to the axis of the airline and can be precisely positioned in such a manner as to generate adjustable microwave reflection factors, and whereas said secondary probe has means for a variable and frequency dependent initial horizontal position relative to the initial position of the primary probe.

2. A method for initializing horizontally the RF probes of the tuner as in claim 1 , where the zero position of the primary probe is at a position closest to the tuner test port, adjacent to the device under test, and the zero position of the secondary probe is at a position adjacent to the primary probe, when said primary probe is at its initial (or zero) position, both zero positions being frequency independent.

3. A method for initializing horizontally the RF probes of the tuner where the zero position of the primary probe is at a position as in claim 2 and the zero position of the secondary probe is at a frequency dependent position adjacent to the far end of the carriage of the primary probe, when the primary carriage is at one half of a wavelength away from its initial (zero) position, at the operating frequency.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2019
From: FOCUSMW IP. INC.
To: TSIRONIS, CHRISTOS
Reel/Frame 048426/0430 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 5, 2013
From: TSIRONIS, CHRISTOS
To: FOCUSMW IP. INC.
Reel/Frame 031145/0579 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2010
From: TSIRONIS, CHRISTOS
To: FOCUS MICROWAVES - FOCUS MICROONDES INC.
Reel/Frame 025095/0222 →
Continuity (2)
Provisional Application 6034324100 · Dec 31, 2001
Related Publication 20030122633A1 · Jul 3, 2003