III-V nitride semiconductor substrate and its production lot, and III-V nitride semiconductor device and its production method
A III–V nitride semiconductor substrate comprising a III–V nitride semiconductor single crystal at least in a surface portion thereof, the product of [H] and [D] being 1×10 25 or less, wherein [H] represents the concentration of hydrogen atoms (the number of hydrogen atoms per cm 3 ) in a surface portion of the single crystal, and [D] represents a dislocation density (the number of dislocations per cm 2 ) on a single crystal surface.
1. A III–V nitride semiconductor substrate comprising a III–V nitride semiconductor single crystal at least in a surface portion thereof, the product of [H] and [D] being 1×10 25 or less, wherein [H] represents the concentration of hydrogen atoms (the number of hydrogen atoms per cm 3 ) in a surface portion of said single crystal, and [D] represents a dislocation density (the number of dislocations per cm 2 ) on a single crystal surface.
2. The III–V nitride semiconductor substrate according to claim 1 , wherein it is a self-supported substrate composed of a III–V nitride semiconductor single crystal.
3. The III–V nitride semiconductor substrate according to claim 1 , wherein said III–V nitride semiconductor single crystal is hexagonal gallium nitride.
4. The III–V nitride semiconductor substrate according to claim 3 , whose substrate surface is a C-plane, on which a group III element appears.
5. The III–V nitride semiconductor substrate according to claim 1 , wherein a surface of said substrate is mirror-polished.
6. The III–V nitride semiconductor substrate according to claim 1 , wherein a surface of said substrate has an arithmetic average roughness Ra of 10 nm or less.
7. A production lot of plural III–V nitride semiconductor substrates, wherein all substrates in said production lot are III–V nitride semiconductor substrates each comprising a III–V nitride semiconductor single crystal at least in a surface portion thereof, the product of [H] and [D] being 1×10 25 or less, wherein [H] represents the concentration of hydrogen atoms (the number of hydrogen atoms per cm 3 ) in a surface portion of said single crystal, and [D] represents a dislocation density (the number of dislocations per cm 2 ) on a single crystal surface.
8. A III–V nitride semiconductor device comprising an epitaxial layer of a III–V nitride semiconductor crystal formed on a III–V nitride semiconductor substrate comprising a III–V nitride semiconductor single crystal at least in a surface portion thereof, the product of [H] and [D] being 1×10 25 or less, wherein [H] represents the concentration of hydrogen atoms (the number of hydrogen atoms per cm 3 ) in a surface portion of said single crystal, and [D] represents a dislocation density (the number of dislocations per cm 2 ) on a single crystal surface.