IP Library Granted Patent US 7,085,301
Granted Patent B2
US 7,085,301 · App. 10/618,034 · Granted Aug 1, 2006

Photonic crystal single transverse mode defect structure for vertical cavity surface emitting laser

Assignees: The Board of Trustees of the University of Illinois; The Furukawa Electric Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,085,301
App. No.
10/618,034
Granted
Aug 1, 2006
Kind
B2
Abstract

The invention is directed to a photonic crystal defect structure for a vertical cavity surface emitting laser (VCSEL). In accordance with the invention, a set of holes is formed in a pattern with one or more missing holes forming a defect in the pattern of the photonic crystal, according to a proscribed depth, hole diameter, and pattern pitch which will insure operation in a single transverse mode.

Claims (103)

1. A vertical cavity surface emitting laser including a vertical cavity, the laser comprising:

a substrate;

a bottom distributed Bragg reflector;

a top distributed Bragg reflector;

an electrical current aperture;

top and bottom electrodes; and

the vertical cavity between said bottom and said top distributed Bragg reflectors containing an active region; wherein said vertical cavity includes:

a plurality of holes arranged in a plurality of patterns; and

at least one missing hole defect in each of said patterns, a ratio of the hole diameter divided by the hole pitch being dependent upon the hole depth and set to produce single transverse mode operation; wherein some of said patterns are different and some are matched to provide transverse optical coupling.

2. The structure of claim 1 , wherein patterns are matched by having matched dimensions of said holes, pitch between holes, hole depth and defect radius.

3. A vertical cavity surface emitting laser including a vertical cavity, the laser comprising:

the substrate;

a bottom distributed Bragg reflector;

a top distributed Bragg reflector;

an electrical current aperture;

top and bottom electrodes; and

a vertical cavity between said bottom and said top distributed Bragg reflectors containing an active region; wherein said vertical cavity includes:

a plurality of holes arranged in a pattern; and

at least one missing hole defect in the pattern, a ratio of the hole diameter divided by the hole pitch being dependent upon the hole depth and set to produce single transverse mode operation;

wherein a radius of said missing hole defect is set to achieve single mode operation; and

wherein dimensions are set such that the V-parameter of the laser is set such that V eff is less than ˜2.405, wherein V eff is defined by:

V

eff

=

2

π

r

λ

n

eff

2

-

(

n

eff

-

γ

Δ

n

)

2

where λ is an operating wavelength, r is an equivalent defect radius, n eff is the effective refractive index of the said vertical cavity without a photonic crystal hole pattern and defect structure present, Δn is the refractive index reduction introduced by the said pattern and said one or more defects, and y is the depth dependence single transverse mode factor.

4. The laser of claim 3 , wherein said plurality of holes and said defect are finite depth holes formed in said top distributed Bragg reflector.

5. The laser of claim 3 , wherein said plurality of holes are finite depth holes that extend through said vertical cavity and extend through at least a part of each of said top and bottom distributed Bragg reflectors.

6. The laser of claim 3 , wherein said plurality of holes are infinite depth holes.

7. The laser of claim 3 , comprising a plurality of defects arranged in said pattern.

8. The structure of claim 7 , wherein said pattern comprises a seven point defect pattern.

9. The structure of claim 8 , further comprises additional seven point defect patterns.

10. The laser of claim 3 , wherein said electrical current aperture comprises an oxidized region in said vertical cavity.

11. The laser of claim 3 , wherein said electrical current aperture comprises an ion implanted region in said vertical cavity.

12. The laser of claim 3 , wherein Δn is set through optimization to an increased amount that maintains V eff is less than ˜2.405.

13. The laser of claim 12 , wherein Δn is set to be greater than 10 −3 .

14. A photonic crystal defect structure in a vertical cavity surface emitting laser including a vertical cavity, the laser comprising:

a substrate;

a bottom electrode electrically contacting said substrate;

a bottom distributed Bragg reflector formed on an opposite side of said substrate from said bottom electrode;

a top distributed Bragg reflector;

a plurality of finite depth holes arranged in a pattern and a missing hole defect in the pattern, the pattern being formed in at least a portion of said top distributed Bragg reflector, the diameter, pitch and depth of the holes being defined by a depth dependence single transverse mode factor;

the vertical cavity including claddings that clad an active region, said vertical cavity being between said top and bottom distributed Bragg reflectors; and

a top electrode including an aperture larger than the pattern;

comprising a plurality of said patterns, wherein some of said patterns are different and some are matched to provide transverse optical coupling.

15. A photonic crystal defect structure in a vertical cavity surface emitting laser, comprising:

a plurality of holes arranged in a pattern; and

at least one missing hole defect in the pattern, a ratio of the hole diameter divided by the hole pitch being dependent upon the hole depth and set to produce single transverse mode operation;

wherein a radius of said missing hole defect is set to achieve single mode operation; and

wherein dimensions are set such that the V-parameter of the laser is set such that V eff is less than ˜2.405, wherein Vis defined by:

V

eff

=

2

π

r

λ

n

eff

2

-

(

n

eff

-

γ

Δ

n

)

2

where γ is an operating wavelength, r is an equivalent defect radius, n eff is the effective refractive index of the said vertical cavity without a photonic crystal hole pattern and defect structure present, Δn is the refractive index reduction introduced by the said pattern and said one or more defects, and γ is the depth dependence single transverse mode factor.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2014
From: FURUKAWA ELECTRIC CO., LTD.
To: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Reel/Frame 032657/0440 →
CONFIRMATORY LICENSE Recorded May 26, 2010
From: UNIVERSITY OF ILLINOIS URBANA-CHAMPAIGN
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 024441/0856 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2004
From: YOKOUCHI, NORIYUKI
To: FUKUKAWA ELECTRIC CO. LTD.
Reel/Frame 014899/0505 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2003
From: CHOQUETTE, KENT D.
To: BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS, THE
Reel/Frame 014802/0305 →
Continuity (3)
Provisional Application 6047207500 · May 20, 2003
Provisional Application 6039548700 · Jul 12, 2002
Related Publication 20040091010A1 · May 13, 2004