Inspection unit
A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member is formed with a plurality of first through holes having a first common diameter and communicating the first face with the second face. A first contact probe is provided with a first tubular body having a second diameter which is smaller than the first diameter, and a first plunger retractably projected from one end of the first tubular body. A second contact probe is provided with a second tubular body having a third diameter which is smaller than the second diameter, and a second plunger retractably projected from one end of the second tubular body. A retainer is formed with a plurality of second through holes having a common shape, and provided on at least the second face of the conductive member so as to communicate the first through holes with the second through holes, so that the first contact probe and the second contact probe are retained in the conductive member while only the first plunger and the second plunger are projected from one ends of the second through holes.
1. An inspection unit, comprising:
a conductive member, having a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected, the conductive member being formed with a plurality of first through holes having a first common diameter and communicating the first face with the second face;
a first contact probe, comprising a first tubular body having a second diameter which is smaller than the first diameter, and a first plunger retractably projected from one end of the first tubular body;
a second contact probe, comprising a second tubular body having a third diameter which is smaller than the second diameter, and a second plunger retractably projected from one end of the second tubular body; and
a retainer, formed with a plurality of second through holes having a common shape, and provided on at least the second face of the conductive member so as to communicate the first through holes with the second through holes, wherein each of the second through holes is adapted to selectively retain one of the first contact probe and the second contact probe in the conductive member while only the first plunger and the second plunger are projected from one end of the second through holes.
2. The inspection unit as set forth in claim 1 , wherein the first contact probe is adapted to transmit a non-RF signal and the second contact probe is adapted to transmit an RF signal.
3. The inspection unit as set forth in claim 1 , wherein each of the second through holes has a first part having a fourth diameter which is smaller than the second diameter and larger than the third diameter, and has a second part having a fifth diameter which is smaller than the third diameter and larger than a diameter of each of the first plunger and the second plunger.
4. The inspection unit as set forth in claim 3 , wherein the retainer comprises an insulative plate member formed with the second through holes.
5. The inspection unit as set forth in claim 3 , wherein the retainer comprises a conductive plate member having third through holes having a common shape and insulative spacers each of which is formed with one of the second through holes and fitted into one of the third through holes.
6. The inspection unit as set forth in claim 3 , wherein an inner diameter of each of the second through hole is varied stepwise so as to have at least the fourth diameter and the fifth diameter.
7. The inspection unit as set forth in claim 3 , wherein an inner diameter of each of the second through hole is varied continuously so as to have at least the fourth diameter and the fifth diameter.
8. The inspection unit as set forth in claim 3 , wherein the second tubular body is longer than the first tubular body.