IP Library Granted Patent US 7,124,347
Granted Patent B2
US 7,124,347 · App. 10/877,897 · Granted Oct 17, 2006

Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture

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Quick Facts
Patent No.
US 7,124,347
App. No.
10/877,897
Granted
Oct 17, 2006
Kind
B2
Abstract

A method for detecting an error in data stored in configuration SRAM and user assignable SRAM in a FPGA comprises providing serial data stream into the FPGA from an external source, loading data from the serial data stream into the configuration SRAM in response to address signals generated by row column counters, loading data from the serial data stream into the user assignable SRAM in response to address signals generated by row and column counters, loading a seed and signature from the serial data stream into a cyclic redundancy checking circuit, cycling data out of configuration SRAM and user assignable SRAM by the row and column counters, performing error checking on the data that has been cycled out of the configuration SRAM and out of the user assignable SRAM by the cyclic redundancy checking circuit, and generating an error signal when an error is detected by the error checking circuit.

Claims (2)

1. An apparatus for detecting error in data stored in a configuration SRAM and a user assignable SRAM, wherein said user assignable SRAM configured to receive data from a serial data stream from an external source in response to address signals generated by row column counters and configured to cycle data out by said row and column counters and wherein said configuration SRAM configured to receive data from said serial data stream in response to address signals generated by row and column counters and configured to cycle data out by said row and column counters, said apparatus comprising:

cyclic redundancy checking circuit that performs error checking on said data that has been cycled out of said configuration SRAM and out of said user assignable SRAM and generates an error signal when an error is detected, said cyclic redundancy checking circuit comprising a linear feedback shift register and wherein a seed and signature is loaded from a serial data stream from said configuration SRAM and user assignable SRAM.

Assignments (2)
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2011
From: WHITE ELECTRONIC DESIGNS CORP.; ACTEL CORPORATION; MICROSEMI CORPORATION
To: MORGAN STANLEY & CO. INCORPORATED
Reel/Frame 025783/0613 →