IP Library › Granted Patent US 7,233,213
Granted Patent B2
US 7,233,213 · App. 11/125,109 · Granted Jun 19, 2007

Oscillator of semiconductor device

Assignee: Hynix Semiconductor Inc.
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Quick Facts
Patent No.
US 7,233,213
App. No.
11/125,109
Granted
Jun 19, 2007
Kind
B2
Abstract

An oscillator of a semiconductor memory device, wherein a reference voltage that flexibly shifts according to the shift in a power supply voltage is generated, and a reference clock is generated using the reference voltage. It is thus possible to generate the reference clock having a constant cycle regardless of the shift in the power supply voltage which can keep constant the duration period of internal control signals of devices, such as a timer and a pump circuit, which are synchronized to the reference clock.

Claims (76)

1. An oscillator of a semiconductor memory device, the oscillator comprising:

a reference voltage generator for generating a reference voltage in such a way that the reference voltage shifts corresponding to a shift in a power supply voltage, wherein

the oscillator compares the reference voltage with a voltage generated according to a predetermined RC delay value, and generates a reference clock according to the comparison result, and

the reference voltage generator is enabled by an enable bar signal.

2. An oscillator of a semiconductor memory device, comprising:

a first voltage generator for generating a first voltage according to a first RC delay value;

a second voltage generator for generating a second voltage according to a second RC delay value;

a reference voltage generator for generating a reference voltage that shifts corresponding to a shift in a power supply voltage;

a first comparator for comparing the first voltage and the reference voltage;

a second comparator for comparing the second voltage and the reference voltage; and

logic combination units for latching output signals of the first and second comparators to generate a reference clock;

wherein the reference voltage generator is enabled by an enable bar signal.

3. The oscillator as claimed in claim 2 , wherein the reference voltage generator generates the reference voltage by dividing the power supply voltage.

4. The oscillator as claimed in claim 2 , wherein the reference voltage generator comprises:

a PMOS transistor that operates according to the enable bar signal; and

first and second resistors for dividing the power supply voltage transferred through the PMOS transistor to generate the reference voltage.

5. The oscillator as claimed in claim 2 , wherein the first voltage generator comprises:

an inverter for inverting an output signal of a first one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the first voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

6. The oscillator as claimed in claim 2 , wherein the second voltage generator comprises:

an inverter for inverting an output signal of a second one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the second voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

7. The oscillator as claimed in claim 2 , wherein the first and second comparators are enabled by the enable bar signal.

8. The oscillator as claimed in claim 2 , wherein each of the logic combination units is composed of a SR latch.

9. An oscillator, comprising:

a first voltage generator for generating a first voltage according to a first RC delay value;

a second voltage generator for generating a second voltage according to a second RC delay value;

a reference voltage generator for generating a reference voltage that shifts corresponding to a shift in a power supply voltage;

a first comparator for comparing the first voltage and the reference voltage;

a second comparator for comparing the second voltage and the reference voltage; and

logic combination units for latching output signals of the first and second comparators to generate a reference clock,

wherein the reference voltage generator is enabled by an enable bar signal.

10. The oscillator as claimed in claim 9 , wherein the reference voltage generator generates the reference voltage by dividing the power supply voltage.

11. The oscillator as claimed in claim 9 , wherein the reference voltage generator comprises:

a PMOS transistor that operates according to the enable bar signal; and

first and second resistors for dividing the power supply voltage transferred through the PMOS transistor to generate the reference voltage.

12. The oscillator as claimed in claim 9 , wherein the first voltage generator comprises:

an inverter for inverting an output signal of a first one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the first voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

13. The oscillator as claimed in claim 9 , wherein the second voltage generator comprises:

an inverter for inverting an output signal of a second one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the second voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

14. The oscillator as claimed in claim 9 , wherein the first and second comparators are enabled by the enable bar signal.

15. The oscillator as claimed in claim 9 , wherein each of the logic combination units is composed of a SR latch.

16. A semiconductor device, comprising:

an oscillator, comprising:

a reference voltage generator for generating a reference voltage in such a way that the reference voltage shifts corresponding to a shift in a power supply voltage;

wherein the oscillator compares the reference voltage with a voltage generated according to a predetermined RC delay value, and generates a reference clock according to the comparison result; and

wherein the reference voltage generator is enabled by an enable bar signal.

17. A semiconductor device, comprising:

an oscillator, comprising:

a first voltage generator for generating a first voltage according to a first RC delay value;

a second voltage generator for generating a second voltage according to a second RC delay value;

a reference voltage generator for generating a reference voltage that shifts corresponding to a shift in a power supply voltage;

a first comparator for comparing the first voltage and the reference voltage;

a second comparator for comparing the second voltage and the reference voltage; and

logic combination units for latching output signals of the first and second comparators to generate a reference clock;

wherein the reference voltage generator is enabled by an enable bar signal.

18. The device as claimed in claim 17 , wherein the reference voltage generator generates the reference voltage by dividing the power supply voltage.

19. The device as claimed in claim 17 , wherein the reference voltage generator comprises:

a PMOS transistor that operates according to the enable bar signal; and

first and second resistors for dividing the power supply voltage transferred through the PMOS transistor to generate the reference voltage.

20. The device as claimed in claim 17 , wherein the first voltage generator comprises:

an inverter for inverting an output signal of a first one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the first voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

21. The device as claimed in claim 17 , wherein the second voltage generator comprises:

an inverter for inverting an output signal of a second one of the logic combination units;

a resistor connected between a PMOS transistor of the inverter and an output terminal from which the second voltage is output; and

a capacitor connected to the output terminal and a ground voltage source.

22. The device as claimed in claim 17 , wherein the first and second comparators are enabled by the enable bar signal.

23. The device as claimed in claim 17 , wherein each of the logic combination units is composed of a SR latch.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2005
From: WON, SAM KYU
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 016554/0295 →
Priority Claims (1)
KR 10-2004-0092096 · Nov 11, 2004 · national
Continuity (1)
Related Publication 20060097813A1 · May 11, 2006