IP Library › Granted Patent US 7,242,173
Granted Patent B2
US 7,242,173 · App. 10/930,188 · Granted Jul 10, 2007

Combined test instrument probe and voltage detector

Assignee: Fluke Corporation
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Quick Facts
Patent No.
US 7,242,173
App. No.
10/930,188
Granted
Jul 10, 2007
Kind
B2
Abstract

A voltage detector is combined with a test instrument probe to provide an indication of the presence of a.c. voltage when the test instrument probe approaches or comes in contact with a source of a.c. voltage.

Claims (12)

1. A test instrument probe, comprising:

a probe body housing a conductive member, wherein at least a portion of said conductive member defines an electrically conductive probe tip; and

a voltage detector being mounted on the probe body, said voltage detector having means for detecting a voltage, and a voltage indicator responsive to said detected voltage,

wherein said means for detecting a voltage is a sensing element coupled to a detector circuit, said sensing element electrically insulated from said conductive member.

2. A test instrument probe in accordance with claim 1 wherein said sensing element is disposed adjacent said electrically conductive probe tip and insulated therefrom.

3. A combined test instrument probe and voltage detector, comprising:

an elongated probe body having a longitudinal axis;

a conductive member disposed along said longitudinal axis, wherein at least a portion of said conductive member extends from said probe body to define an electrically conductive probe tip; and

a voltage detector disposed in juxtaposition with said conductive member, said voltage detector including means for detecting a voltage, and a voltage indicator responsive to said detected voltage,

wherein said means for detecting a voltage is a sensing element coupled to a detector circuit, said sensing element electrically insulated from said conductive member.

4. A combined test instrument probe and voltage detector in accordance with claim 3 wherein said sensing element is disposed adjacent said electrically conductive probe tip and insulated therefrom.

5. A combined test instrument probe and voltage detector in accordance with claim 4 wherein said means for detecting a voltage is an electrically conductive contacting tip coupled to a detector circuit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2004
From: CAVORETTO, JAMES L.
To: FLUKE CORPORATION
Reel/Frame 015759/0456 →
Continuity (1)
Related Publication 20060043959A1 · Mar 2, 2006