IP Library › Granted Patent US 7,259,110
Granted Patent B2
US 7,259,110 · App. 11/114,870 · Granted Aug 21, 2007

Manufacturing method of display device and semiconductor device

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 7,259,110
App. No.
11/114,870
Granted
Aug 21, 2007
Kind
B2
Abstract

It is an object of the present invention to improve the surface planarity of a film by uniforming the thickness of an insulating layer. Further, it is another object of the invention to provide a technology for manufacturing an electronic device typified by a high-definition and high-quality display device with high yield at low cost with the use of the insulating layer. In a method for manufacturing a semiconductor device according to the invention, a semiconductor layer is formed; an insulating layer is formed over the semiconductor layer; a wiring layer connected to the semiconductor layer is formed in an opening provided in the insulating layer; and an electrode layer connected to the wiring layer is formed. The insulating layer is formed by spin coating with a composition containing an insulating material, which has a viscosity of from 10 mPa·s to 50 mPa·s.

Claims (80)

1. A method for manufacturing a semiconductor device, comprising the steps of:

forming a semiconductor layer;

forming an insulating layer over the semiconductor layer;

forming an opening in the insulating layer;

forming a wiring layer connected to the semiconductor layer in the opening; and

forming an electrode layer connected to the wiring layer,

wherein the insulating layer is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 10 mPa·s to 50 mPa·s.

2. A method for manufacturing a semiconductor device according to claim 1 ,

wherein the insulating layer is formed by spin coating with a composition containing an insulating material,

wherein the composition has a viscosity of from 20 mPa·s to 35 mPa·s.

3. A method for manufacturing a semiconductor device according to claim 1 , wherein the insulating layer comprises a siloxane polymer.

4. A method for manufacturing a semiconductor device according to claim 1 , the insulating layer is formed so as to have a thickness of from 0.1 μm to 10 μm.

5. A method for manufacturing a semiconductor device, comprising the steps of:

forming a semiconductor layer;

forming a first insulating layer over the semiconductor layer;

forming a first opening in the first insulating layer;

forming a wiring layer connected to the semiconductor layer in the first opening;

forming a second insulating layer over the first insulating layer and the wiring layer;

forming a second opening in the second insulating layer; and

forming an electrode layer connected to the wiring layer in the second opening,

wherein each of the first and the second insulating layers is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 10 mPa·s to 50 mPa·s.

6. A method for manufacturing a semiconductor device according to claim 5 ,

wherein each of the first and the second insulating layers is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 20 mPa·s to 35 mPa·s.

7. A method for manufacturing a semiconductor device according to claim 5 , wherein each of the first and the second insulating layers comprises a siloxane polymer.

8. A method for manufacturing a semiconductor device according to claim 5 , wherein each of the first and the second insulating layers is formed so as to have a thicknesses of from 0.1 μm to 10 μm.

9. A method for manufacturing a semiconductor device according to claim 1 ,

wherein the semiconductor layer is formed over a substrate having an insulating surface, the semiconductor layer has a source region and a drain region, and the wiring layer is connected to the source region or the drain region.

10. A method for manufacturing a semiconductor device according to claim 5 ,

wherein the semiconductor layer is formed over a substrate having an insulating surface, the semiconductor layer has a source region and a drain region, and the wiring layer is connected to the source region or the drain region.

11. A method for manufacturing a semiconductor device according to claim 9 ,

wherein a flexible substrate is used as the substrate having an insulating surface.

12. A method for manufacturing a semiconductor device according to claim 10 ,

wherein a flexible substrate is used as the substrate having an insulating surface.

13. A method for manufacturing a display device, comprising the steps of:

forming a semiconductor layer;

forming an insulating layer over the semiconductor layer;

forming an opening in the insulating layer;

forming a wiring layer connected to the semiconductor layer in the opening; and

forming an a pixel electrode over the wiring layer and connected to the wiring layer,

wherein the insulating layer is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 10 mPa·s to 50 mPa·s.

14. A method for manufacturing a display device according to claim 13 ,

wherein the insulating layer is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 20 mPa·s to 35 mPa·s.

15. A method for manufacturing a display device according to claim 13 , wherein the insulating layer comprises a siloxane polymer.

16. A method for manufacturing a display device according to claim 13 , wherein the insulating layer is formed so to have a thickness of from 0.1 μm to 10 μm.

17. A method for manufacturing a display device, comprising the steps of:

forming a semiconductor layer;

forming a first insulating layer over the semiconductor layer;

forming a first opening in the first insulating layer;

forming a wiring layer connected to the semiconductor layer in the first opening;

forming a second insulating layer over the first insulating layer and the wiring layer;

forming a second opening in the second insulating layer; and

forming a pixel electrode layer over the wiring layer and connected to the wiring layer in the second opening,

wherein each of the first and the second insulating layers is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 10 mPa·s to 50 mPa·s.

18. A method for manufacturing a display device according to claim 17 ,

wherein each of the first and the second insulating layers is formed by spin coating with a composition containing an insulating material, and

wherein the composition has a viscosity of from 20 mPa·s to 35 mPa·s.

19. A method for manufacturing a display device according to claim 17 , wherein each of the first and the second insulating layers comprises a siloxane polymer.

20. A method for manufacturing a display device according to claim 17 , wherein each of the first and the second insulating layers is formed so as to have a thicknesses of from 0.1 μm to 10 μm.

21. A method for manufacturing a display device according to claim 13 ,

wherein the semiconductor layer is formed over a substrate having an insulating surface, the semiconductor layer has a source region and a drain region, and the wiring layer is connected to the source region or the drain region.

22. A method for manufacturing a display device according to claim 17 ,

wherein the semiconductor layer is formed over a substrate having an insulating surface, the semiconductor layer has a source region and a drain region, and the wiring layer is connected to the source region or the drain region.

23. A method for manufacturing a display device according to claim 21 ,

wherein a flexible substrate is used as the substrate having an insulating surface.

24. A method for manufacturing a display device according to claim 22 ,

wherein a flexible substrate is used as the substrate having an insulating surface.

25. A display device according to claim 13 ,

wherein an electroluminescent layer is formed over the pixel electrode.

26. A display device according to claim 17 ,

wherein an electroluminescent layer is formed over the pixel electrode.

27. A display device according to claim 13 ,

wherein a liquid crystal element is formed over the pixel electrode.

28. A display device according to claim 17 ,

wherein a liquid crystal element is formed over the pixel electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2005
From: OHNUMA, HIDETO; OGINO, KIYOFUMI; FUJII, TERUYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 016515/0009 →
Priority Claims (1)
JP 2004-134719 · Apr 28, 2004 · national
Continuity (1)
Related Publication 20050245078A1 · Nov 3, 2005