IP Library › Granted Patent US 7,268,647
Granted Patent B2
US 7,268,647 · App. 11/626,270 · Granted Sep 11, 2007

Film bulk acoustic-wave resonator and method for manufacturing the same

Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 7,268,647
App. No.
11/626,270
Granted
Sep 11, 2007
Kind
B2
Abstract

A film bulk acoustic-wave resonator having, a substrate having a cavity, the substrate being formed of one of semi-insulating material and high-resistivity material, a bottom electrode partially fixed to the substrate, part of the bottom electrode is mechanically suspended above the cavity, a piezoelectric layer disposed on the bottom electrode, the shape of the piezoelectric layer is defined by a contour, a top electrode on the piezoelectric layer, a semiconductor intermediate electrode buried at and in a surface of the substrate, being located at the contour of the piezoelectric layer, the semiconductor region having a lower resistivity than the substrate, the intermediate electrode is connected to the bottom electrode in the inside of the contour, and a bottom electrode wiring connected to the semiconductor intermediate electrode extending from the contour to an outside of the contour in the plan view.

Claims (20)

1. A film bulk acoustic-wave resonator comprising:

a substrate having a cavity, the substrate being formed of one of semi-insulating material and high-resistivity material;

a bottom electrode partially fixed to the substrate, part of the bottom electrode is mechanically suspended above the cavity;

a piezoelectric layer disposed on the bottom electrode, the shape of the piezoelectric layer is defined by a contour;

a top electrode on the piezoelectric layer;

a semiconductor intermediate electrode buried at and in a surface of the substrate, being located at the contour of the piezoelectric layer, the semiconductor region having a lower resistivity than the substrate, the intermediate electrode is connected to the bottom electrode in the inside of the contour; and

a bottom electrode wiring connected to the semiconductor intermediate electrode extending from the contour to an outside of the contour in the plan view,

wherein a longitudinal vibration mode along a thickness direction of the piezoelectric layer is utilized.

2. The film bulk acoustic-wave resonator of claim 1 , further comprising:

an inter-layer dielectric film formed on the piezoelectric layer, the semiconductor substrate being laid bare from the contour of the piezoelectric layer and the semiconductor intermediate electrode,

wherein through a first contact window formed in the inter-layer dielectric film, the top electrode is electrically connected to the piezoelectric layer and through a second contact window formed in the inter-layer dielectric film, the bottom electrode wiring is electrically connected to the semiconductor intermediate electrode.

3. The film bulk acoustic-wave resonator of claim 2 , wherein the cavity is an open cavity implemented by a through-hole penetrating the substrate along a direction from the bottom surface of the substrate to the top surface of the substrate for exposing a bottom surface of the bottom electrode.

4. The film bulk acoustic-wave resonator of claim 2 , wherein the cavity is a closed cavity implemented by a groove dug at a top surface of and in the substrate.

5. A method for manufacturing a film bulk acoustic-wave resonator, comprising:

forming a semiconductor intermediate electrode on a semiconductor substrate, the semiconductor intermediate electrode having a lower resistivity than the semiconductor substrate;

stacking a metallic film for forming a bottom electrode on the entire surface of the semiconductor substrate so as to include the semiconductor intermediate electrode;

stacking a piezoelectric dielectric film on the entire surface of the bottom electrode and on the semiconductor intermediate electrode;

delineating the piezoelectric dielectric film and the metallic film with an identical etching mask so as to form the piezoelectric layer and the bottom electrode, the piezoelectric layer has a same shape and a same size as the bottom electrode in a plan view, the bottom electrode is connected to the semiconductor intermediate electrode;

forming a top electrode on the piezoelectric layer; and

forming a bottom electrode wiring so as to be connected to the semiconductor intermediate electrode.

Priority Claims (2)
JP 2004-124774 · Apr 20, 2004 · national
JP 2005-099911 · Mar 30, 2005 · national
Continuity (2)
Division 1110867100 · Apr 19, 2005
Related Publication 20070115078A1 · May 24, 2007